Hostname: page-component-745bb68f8f-f46jp Total loading time: 0 Render date: 2025-01-12T08:17:04.518Z Has data issue: false hasContentIssue false
  • English
  • Français

Possibility of High-Tc Copper Fluoride Oxide Superconductors

Published online by Cambridge University Press:  28 February 2011

P. T. Wu ,
R. S. Liu ,
H. M. Sung  and
J. H. Rung
P. T. Wu
Affiliation:
Materials Research Laboratories, Industrial Technology Research Institute, 195 Chung-hsing Rd., Sec. 4, Chutung, Hsinchu 31015, Taiwan, Republic of, China.
R. S. Liu
Affiliation:
Materials Research Laboratories, Industrial Technology Research Institute, 195 Chung-hsing Rd., Sec. 4, Chutung, Hsinchu 31015, Taiwan, Republic of, China.
H. M. Sung
Affiliation:
Materials Research Laboratories, Industrial Technology Research Institute, 195 Chung-hsing Rd., Sec. 4, Chutung, Hsinchu 31015, Taiwan, Republic of, China.
J. H. Rung
Affiliation:
Materials Research Laboratories, Industrial Technology Research Institute, 195 Chung-hsing Rd., Sec. 4, Chutung, Hsinchu 31015, Taiwan, Republic of, China.
Get access

Abstract

Superconductivity of YBa2Cu3FxOy system prepared by using a mixed solid state and gel method. A consistent and non-zero resistance drop near 280K was achieved in the nominal YBa2Cu3FxOy system for x=l and 2, with complete loss of resistance at 90K. The metal-semiconductor transition occurs at x value between 2 and 3. Temporal room temperature superconductivity with zero resistance was observed in a YBa2Cu3F2Oy sample at 308K. The phenomenon lasted for three minutes and was not reproducible.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 623
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Bednorz, J.G. and Müller, K.A., Z. Phys. B., 64 (1986) 189.Google Scholar
[2] Wu, M.K., Ashburn, J.R., Torng, C.J., Hor, P.H., Meng, R.L., Gao, L., Huang, Z.J., Wang, Y.Q. and Chu, C.W., Phys. Rev. Lett., 58 (1987) 908.Google Scholar
[3] Hikami, S., Hirai, T. and Kagoshima, S., Jpn. J. Appl. Phys., 26 (1987) L314 Google Scholar
[4] Ovshinsky, S.R., Young, R.T., Allred, D.D., MeMaggio, G. and Van der Leeden, G.A., Phys. Rev. Lett., 58, (1987) 2579.Google Scholar
[5] Huang, C.Y., Dries, L.J., Hor, P.H., Meng, R.L., Chu, C.W. and Frankl, R.B., Nature, 328 (1987) July.Google Scholar
[6] Ihara, H., Terada, N., Jo, M., Hirabayashi, M., Tokumoto, M., Kimura, Y., Matsubara, T. and Sugise, R., Jpn. J. Appl. Phys., 26 (1987) 169.Google Scholar