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Positron Lifetime Studies of Defect Structures in Bal-xKxBiO3

Published online by Cambridge University Press:  26 February 2011

J.C. O'Brien ,
R.H. Howell ,
H.B. Radousky ,
P.A. Sterne ,
D.G. Hinks ,
T.J. Folkerts  and
R.N. Shelton
J.C. O'Brien
Affiliation:
Lawrence Livermore National Laboratory,Livermore CA,
R.H. Howell
Affiliation:
Lawrence Livermore National Laboratory,Livermore CA,
H.B. Radousky
Affiliation:
Lawrence Livermore National Laboratory,Livermore CA,
P.A. Sterne
Affiliation:
Lawrence Livermore National Laboratory,Livermore CA,
D.G. Hinks
Affiliation:
Argonne National Laboratory,Argonne IL,
T.J. Folkerts
Affiliation:
University of California, Davis CA
R.N. Shelton
Affiliation:
University of California, Davis CA
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Abstract

Temperature-dependent positron lifetime experiments have been performed from room temperature to cryogenic temperatures on Ba1−xKxBiO3. for x=0.4 and 0.5. From the temperature dependence of the positron lifetime in the normal state, we observe a clear signature of competition between separate defect populations to trap the positron. Theoretical calculations of lifetimes of free or trapped positrons have been performed on Ba1−xKxBiO3, to help identify these defects. Lifetime measurements separated by long times have been performed and evidence of aging effects in the sample defect populations is seen in these materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 877
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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