Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-03T08:38:13.934Z Has data issue: false hasContentIssue false
  • English
  • Français

Photothermal Investigation of Surfaces and Interfaces in Amorphous Silicon Films

Published online by Cambridge University Press:  25 February 2011

G. Amato ,
L. Boarino ,
Giuliana Benedetto  and
R Spagnolo
G. Amato
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
L. Boarino
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
Giuliana Benedetto
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
R Spagnolo
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
Get access

Abstract

A method for the determination of surface and interface states is suggested, based on the observation of interference fringe pattern in photo-thermal spectra. Some experimental results are presented and interpreted by means of a theoretical approach. The method allows in most cases to get an evaluation of surface and interface density of states.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 192: Symposium O – Amorphous Silicon Technology - 1990 , 1990 , 207
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Jackson, W.B., Amer, N., Phys. Rev. B 25, 5559 (1982).Google Scholar
2. Smith, Z.E., Chu, A., Shepard, K., Alijishi, S., Slobodin, D., Kolodzey, J., Wagner, S., Appl. Phys. Lett. 50, 1521 (1987).Google Scholar
3. Amato, G., Benedetto, G., Fizzotti, F., Manfredotti, C., Spagnolo, R., Phys. Stat. Sol. (a), 118, 111 (1990).Google Scholar
4. See e.g. Vasicek, A., Optics of Thin Films (North-Holland, Amsterdam 1960).Google Scholar
5. Shimizu, T., Xu, X., Kidoh, H., Morimoto, A., Kumeda, M., J. Appl. Phys. 64, 5045 (1988).Google Scholar