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Phase Transition Temperature of Ferroelectric Thin Film Evaluated by Four-State Potts Model

Published online by Cambridge University Press:  26 February 2011

Wing Yee Winnie Chung
Affiliation:
[email protected], The Hong Kong Polytechnic University, Department of Applied Physics, BC614, Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, N/A, N/A, Hong Kong, (00852)27665883, (00852)23337629
Veng Cheong Lo
Affiliation:
[email protected], The Hong Kong Polytechnic University, Department of Applied Physics, Hong Kong
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Abstract

An epitaxial ferroelectric thin film can be modeled by a two-dimensional array of dipoles. The orientation of each dipole is assigned to one of the four possible states which are mutually perpendicular to each other. Consequently, the whole film can be divided into domains with both 90° and 180° domain walls. The dominant switching mechanism for individual dipole is implemented by a 90° rotation. Two different conditions have been considered. For the first one (model A), every dipole inside the film is allowed to rotate, provided that it is thermally activated. For the second (model B), only the dipole rotation is restricted to those at the domain walls. The phase transition temperatures under these two models have been evaluated. Furthermore, the effects of sample size and boundary condition are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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