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Orientation Dependent X-Ray Absorption Near Edge Structure in YBa2Cu3O7 and La1.85Sr0.15ISCUO4

Published online by Cambridge University Press:  28 February 2011

S. M. Heald ,
J. M. Tranquada ,
A. R. Moodenbaugh  and
Y. Xu
S. M. Heald
Affiliation:
Division of Materials Science, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
J. M. Tranquada
Affiliation:
Division of Materials Science, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
A. R. Moodenbaugh
Affiliation:
Division of Materials Science, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
Y. Xu
Affiliation:
Division of Materials Science, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
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Abstract

X-ray absorption measurements have been made on powder samples of YBa2Cu3O7 and La1.85sr0.15CuO4 oriented in a magnetic field. Measurements made at the Cu K edge with the x-ray polarization oriented perpendicular and parallel to the c-axis show distinct differences for both materials, indicating a strong anisotropy of the electronic states about the Cu atoms. The Y edge measurements show a much smaller anisotropy as expected due to its more symmetric environment. Preliminary analysis indicates these measurements should be useful in choosing between the conflicting interpretations of the near edge structure in these materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 757
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Tranquada, J. M., Heald, S. M., and Moodenbaugh, A. R., Phys. Rev. B.Google Scholar
2. Tranquada, J. M., Heald, S. M., Moodenbaugh, A. R., and Suenaga, M., Phys. Rev. B35, 7187 (1987).Google Scholar
3. Oyanagi, H., Ihara, H., Matsushita, T., Tokumoto, M., Hirabayashi, M., Terada, N., Senzai, K., Kimura, Y., and Yao, T., Jpn. J. Appl. Phys. 26 L488 (1987).Google Scholar
4. Alp, E. E., Shenoy, G. K., Hinks, D. G., Capone, D. W. II, Soderholm, L., Schüttler, H.-B., Guo, J., Ellis, D. E., Montano, P. A., and Ramanathan, M., Phys. Rev. B35, 7199 (1987).Google Scholar
5. Boyce, J. B., Bridges, F., Claeson, T., Howland, R. S., and Geballe, T. H., Phys. Rev. B.Google Scholar
6. Lytle, F. W., Gregor, R. B., and Panson, A. J., to be published.Google Scholar
7. Mansour, A. N., Cullen, J., Ashburn, J. R., and Jeeb, C. S., to be published.Google Scholar
8. Crozier, E. D., Alberding, N., Bauchspiess, K. R., Seary, A. J., and Gygaux, S., to be published.Google Scholar
9. Baudelet, F., Collin, G., Dartyge, E., Fontaine, A., Kappler, J. P., Krill, G., Itie, J. P., Jegoudez, J., Maurer, M., Monod, Ph., Revcolevschi, A., Tolentino, H., Tourillon, G., and Verdaguer, M., to be published.Google Scholar
10. Farrell, D. E., Chandrasekhar, B. S., DeGuire, M. R., Fang, M. M., Kogan, V. G., Clem, J. R., and Finneraore, D. K., Phys. Rev. B36, 4025 (1987).Google Scholar
11. Cava, R. J., VanDover, B., Batlogg, B., and Rietman, E. A., Phys. Rev. Lett. 58, 408 (1987).Google Scholar
12. Cava, R. J., Batlogg, B., VanDover, B., Murphy, R. B., Sunshine, D. W., Siegrist, S., Remeika, J. P., Rietman, E. A., and Zahaurak, J., Phys. Rev. Lett. 58, 1676 (1987).Google Scholar