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Optical Properties of Semiconducting Amorphous Multilayers Consisting of Disordered Wells and Ordered Barriers

Published online by Cambridge University Press:  25 February 2011

S. Nitta ,
T. Itoh ,
S. Nonomura  and
K. Morigaki
S. Nitta
Affiliation:
Department of Electronic and Computer Engineering, Gifu University, Gifu 501-11Japan Department of Physics, The University of Utah, 201 JFB, Salt Lake City, UT 84112
T. Itoh
Affiliation:
Department of Electronic and Computer Engineering, Gifu University, Gifu 501-11Japan
S. Nonomura
Affiliation:
Department of Electronic and Computer Engineering, Gifu University, Gifu 501-11Japan
K. Morigaki
Affiliation:
ISSP, The University of Tokyo, Roppongi, Tokyo 106Japan
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Abstract

The optical properties of random multilayer films are presented. Very small disorder in the well layer thickness (3 A standard deviation in 20 A) change the optical properties drastically. These optical spectrum are found to be useful to detect the disorder in the multilayers and also are very suitable to investigate the properties of randomness.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 149: Symposium E – Amorphous Silicon Technology - 1989 , 1989 , 693
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

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