Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-28T15:08:40.149Z Has data issue: false hasContentIssue false

On the Relation of Mechanical Deformation and Electrical Properties of BN Nanotubes

Published online by Cambridge University Press:  31 January 2011

Hessam Ghassemi
Affiliation:
[email protected], michigan technological university, houghton, Michigan, United States
Chee Huei Lee
Affiliation:
[email protected], Michigan Technological University, Physics, Houghton, Michigan, United States
Yoke Khin Yap
Affiliation:
[email protected], Michigan Technological University, Physics, Houghton, Michigan, United States
Reza Shahbazian Yassar
Affiliation:
[email protected], michigan technological university, houghton, Michigan, United States
Get access

Abstract

Using a novel in-situ scanning tunneling microcopy integrated into a 200Kv transmission electron microscopy, we have shown that boron nitride nanotubes (BNNTs) posses remarkable flexibility and convert from insulator to semi-conductor upon bending. To measure the electrical properties, the BNNT was bent between two gold contacts constructing a metal-semiconductor-metal circuit. The resistivity of the BNNT under bending condition was measured to be ∼460 MΩ from the experimentally recorded current-voltage data. Our finding suggests that mechanical straining can improve the electrical transport in BN nanotubes via reducing the band gap.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Golberg, D., Bando, Y., Tang, C. C. and Zh, C. Y., Adv. Mat. 19, 2413 (2007).Google Scholar
2. Wang, J., Kayastha, V. K., Yap, Y. K., Zhiyong, F., Lu, J. G., Pan, Z., Ivanov, I. N., Puretzky, A. A. and Geohegan, D. B., Nano Lett. 5, 2528 (2005).Google Scholar
3. Bai, X. D., Golberg, D., Bando, Y., Zhi, C. Y., Tang, C. C., Mitome, M. and Kurashima, K., Nano Letts. 7, 2146 (2007).10.1021/nl062540lGoogle Scholar
4. Kim, Y. H., Chang, K. J. and Louie, S. G., Phys. Rev. B, 63, 205408 (2001).Google Scholar
5. Lee, C. H., Wang, J., Kayatsha, V. K., Huang, J. Y. and Yap, Y. K., Nanotech. 19, 455605 (2008).10.1088/0957-4484/19/45/455605Google Scholar