Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-02T23:26:45.461Z Has data issue: false hasContentIssue false

New Approaches to Molecular Dynamics Simulations of a-Si:H

Published online by Cambridge University Press:  16 February 2011

Qiming Li
Affiliation:
Department of Physics and Astronomy and Microelectronics Research Center, Iowa State University, AMes, IA 50011
R. Biswas
Affiliation:
Department of Physics and Astronomy and Microelectronics Research Center, Iowa State University, AMes, IA 50011
C.M. Soukoulis
Affiliation:
Department of Physics and Astronomy and Microelectronics Research Center, Iowa State University, AMes, IA 50011
Get access

Abstract

A new tight-binding molecular dynamics approach for Si-H systems is developed using the valence orbitale of Si and H for calculation of atomic forces. Previous tight-binding models are not able to describe formation energies of different charge states of H in c-Si and new physics is introduced in our model to describe both effects of charge transfer and varying atomic environments. The Si-H Model was developed by fitting to silane, and ensuring that the formation energies of different charge states of H in c-Si were correctly described. This new model also describes well vibrational properties of SiHn configurations, and the structural and electronic properties of a-Si:H Models. The new molecular dynamics utilizes quantum mechanical forces, incorporating important electronic effects, and is robust enough to simulate hundreds of atoms as would be needed in realistic a-Si:H systems.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Buda, F., Chiarotti, G., Car, R., Parrinello, M., Phys. Rev. B 44, 5908 (1991).Google Scholar
[2] Kwon, I., Biswas, R., and Soukoulis, C.M., Phys. Rev. B 45, 3332 (1992).Google Scholar
[3] Mosseau, N. and Lewis, L.J., Phys. Rev. B 43, 9810 (1991) ;Google Scholar
[4] Chadi, D.J., Phys. Rev. B 29, 785 (1984).Google Scholar
[5] Goodwin, L., Skinner, A. J. and Pettifor, D. G., Europhys. Lett. 9, 701 (1989).CrossRefGoogle Scholar
[6] Xu, C. H., Wang, C. Z., Chan, C. T., and Ho, K. M., J. Phys. Conden. Matt. 4, 4047 (1992).Google Scholar
[7] Min, B.J., Lee, Y.H., Wang, C.Z., Chan, C. T., and Ho, K.M., Phys. Rev. 45, 6839 (1992).Google Scholar
[8] Cardona, M., Phys. Stat. Sol. (b) 118, 463 (1983).CrossRefGoogle Scholar
[9] Van de Walle, C.G., Denteneer, P.J.H., Bar-Yam, Y., and Pantelides, S.T., Phys. Rev. B 39, 10791 (1989).CrossRefGoogle Scholar
[10] Kwon, I., Biswas, R., Wang, C.Z., Soukoulis, C.M., and Ho, K.M., Phys. Rev. B 49, 7242 (1994).Google Scholar
[11] Guttman, L. and Fong, C.Y., Phys. Rev. B 26, 6756 (1982).CrossRefGoogle Scholar
[12] Branz, H. M. and Schiff, E.A., Phys. Rev. B 48, 8667 (1993).Google Scholar