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Nanoscale Properties of SrBi2Ta2O9 Thin Films
Published online by Cambridge University Press: 21 March 2011
Abstract
Piezoresponse scanning force microscopy (PFM) was applied to study the nanoscale mechanism of retention loss in SrBi2Ta2O9 (SBT) thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at different time intervals. The retention behavior of the films was studied as a function of switching conditions and electrode material. SFM was also used for nanoscale mapping of leakage current sites and investigation of electrical conduction mechanism at these sites. For the first time, the development of dielectric breakdown in SBT films was directly observed at nanoscale.
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- Copyright © Materials Research Society 2001
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