Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T08:05:19.894Z Has data issue: false hasContentIssue false
  • English
  • Français

NanoLAB Triboprobe: Characterizing Dynamic Wear, Friction and Fatigue at the Nanoscale

Published online by Cambridge University Press:  21 March 2011

A J Lockwood ,
J Wedekind ,
R S Gay ,
J J Wang ,
M S Bobji ,
B Amavasai ,
M Howarth ,
G Möbus  and
B J Inkson
A J Lockwood
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD, UK
J Wedekind
Affiliation:
MMVL, Sheffield Hallam University, Sheffield, S1 1WB, UK
R S Gay
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD, UK
J J Wang
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD, UK
M S Bobji
Affiliation:
Department of Mechanical Engineering, Indian Institute of Science, Bangalore, 560 012, India
B Amavasai
Affiliation:
MMVL, Sheffield Hallam University, Sheffield, S1 1WB, UK
M Howarth
Affiliation:
MMVL, Sheffield Hallam University, Sheffield, S1 1WB, UK
G Möbus
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD, UK
B J Inkson
Affiliation:
Department of Engineering Materials, The University of Sheffield, Sheffield, S1 3JD, UK
Get access

Abstract

In-situ transmission electron microscopy (TEM) has developed rapidly over the last decade. In particular, with the inclusion of scanning probes in TEM holders, allows both mechanical and electrical testing to be performed whilst simultaneously imaging the microstructure at high resolution. In-situ TEM nanoindentation and tensile experiments require only an axial displacement perpendicular to the test surface. However, here, through the development of a novel in-situ TEM triboprobe, other surface characterisation experiments are now possible, with the introduction of a fully programmable 3D positioning system.

Programmable lateral displacement control allows scratch tests to be performed at high resolution with simultaneous imaging of the changing microstructure. With the addition of repeated cyclic movements, both nanoscale fatigue and friction experiments can also now be performed. We demonstrate a range of movement profiles for a variety of applications, in particular, lateral sliding wear.

The developed NanoLAB TEM triboprobe also includes a new closed loop vision control system for intuitive control during positioning and alignment. It includes an automated online calibration to ensure that the fine piezotube is controlled accurately throughout any type of test. Both the 3D programmability and the closed loop vision feedback system are demonstrated here.

Keywords

tribologytransmission electron microscopy (TEM)nanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1297: Symposium P – Deformation Mechanisms, Microstructure Evolution and Mechanical Properties of Nanoscale Materials , 2011 , mrsf10-1297-p03-61
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Kizuka, T, Yamada, K, Deguchi, S, Naruse, M, and Tanaka, N. Physical Review B, 1997. 55(12): p. R7398.Google Scholar
[2] Svensson, K, Jompol, Y, Olin, H, and Olsson, E. Rev. Sci. Instrum., 1995. 74: p. 4945–4947.Google Scholar
[3] Stach, E A, Freeman, T, Minor, A M, Owen, D K, Cumings, J, Wall, M A, Chraska, T, Hull, R, Morris, J W, and , A Jr. Microscopy and Microanalysis, 2001. 7(06): p. 507–517.Google Scholar
[4] Bobji, M S, Ramanujan, C S, Pethica, J B, and Inkson, B J. Meas. Sci. Technol., 2006. 17: p. 1324–1329.Google Scholar
[5] Lockwood, A J, Wedekind, J, Gay, R S, Bobji, M S, Amavasai, B, Howarth, M, Möbus, G, and Inkson, B J. Meas. Sci. Technol., 2010. 21: p. 075901.Google Scholar
[6] Wang, J J, Lockwood, A J, Peng, Y, Xu, X, Bobji, M S, and Inkson, B J. Nanotechnology, 2009. 20(30): p. 305703.Google Scholar
[7] Lockwood, A J, Bobji, M S, Bunyan, R J T, and Inkson, B J. J. Phys.: Conf. Ser., 2009.Google Scholar
[8] Lockwood, A J, Bunyan, R J T, and Inkson, B J, In-situ TEM mechanical testing of a Si MEMS nanobridge, in EMC 2008, Instrumentation and Methods, Luysberg, K T M, Weirich, T, Editor. 2008, Springer-Verlag: Aachen, Germany. p. 495–496.Google Scholar
[9] Lockwood, A J, Anantheshwara, K, Bobji, M S, and Inkson, B J. Nanotechnology, 2011. 22(10): p. 105703.Google Scholar
[10] Lockwood, A J, Wang, J J, Gay, R, and Inkson, B J. in J. Phys.: Conf. Ser. 2008. Glasgow, UK: IOP.Google Scholar
[11] Wang, J J, Lockwood, A J, Gay, R, and Inkson, B J. J. Phys.: Conf. Ser., 2008. 126: p. 012095.Google Scholar
[12] Briston, K J, Peng, Y, Cullis, A G, and Inkson, B J. Materials Letters, 2010. 64(14): p. 1583–1586.Google Scholar