Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T05:01:55.913Z Has data issue: false hasContentIssue false

Modeling the Organic Thin Film Transistors

Published online by Cambridge University Press:  01 February 2011

Viorel Olariu
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Robert Rotzoll
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Siddharth Mohapatra
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Robert Wenz
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Michelle Grigas
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Klaus Dimmler
Affiliation:
Organic ID, Inc., Colorado Springs, CO
Get access

Abstract

Organic thin-film transistors (OTFTs) appear to have become strong contenders to silicon based MOSFET devices whenever low-cost and relatively low performance circuits are required in applications such as radio frequency identification (RFID) for large volume supply chains. In order to develop circuits based on OTFTs, circuit designers require circuit models that predict the operation of OTFT with a reasonable accuracy. Although, generally, OTFT operation is similar to ordinary silicon MOSFET devices, there are several characteristics that clearly differentiate them. One important difference between the operation of the OTFT and the silicon MOSFET (that is a direct consequence of the physical implementation of OTFT) is that the organic transistor is normally operated in the accumulation mode, while the silicon transistor regularly operates in the inversion mode. Due to the molecular nature of the semiconductor, the carrier mobility is orders of magnitude lower than for the silicon MOSFET. Variable carrier mobility law, low on/off ratio, and the Schottky barrier at the interface between the source/drain metal contact and the organic semiconductor are among other important effects that had to be considered for developing of an accurate circuit model of the organic transistor. The developed model has been used to simulate DC characteristics and also simple circuits such as logic gates, ring oscillators, rectifiers, etc.

This paper presents the developed model as well as a comparison between the simulated data and the experimental data. The experimental circuits were fabricated on flexible plastic substrates and employed a solution-cast dielectric. Pentacene was the semiconductor of choice with carrier mobility in the range of 0.1 – 1.5 cm2/V.s.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Mohapatra, S., Grigas, M., Wenz, R., Rotzoll, R., Olariu, V., Shchekin, O., Dimmler, K., and Dodabalapur, A., to be published in the MRS Proceedings, Spring 2005.Google Scholar
2 Shur, M.S., Slade, H.C., Ytterdal, T., Wang, L., Xu, Z., Aflatooni, K., Byun, Y, Chen, Y., Froggartt, M., Krishnan, A., Nei, P., Meiling, H., Min, B.-H., Nathan, A., Scherman, S., Stewart, M., and Theiss, S.D., MRS Proceedings, Amorphous and Microcrystalline Silicon Technology, 467, 1997.Google Scholar
3 Shur, M. and Hack, M., Journal of Applied Physics - Volume 55, Issue 10, pp. 38313842, May 15, 1984 Google Scholar
4 Necliudov, P.V., Shur, M.S., Gundlach, D.J., and Jackson, T.N., Journal of Applied Physics, Vol. 88, Number 11, Dec. 2000.Google Scholar
5 Brederlow, R., Briole, S., Klauk, H., Halik, M., Zschieschang, U., Schmid, G., Gorriz-Saez, J.-M., Thewes, R., and Weber, W., ISSCC 2003, Session 21, 2003.Google Scholar