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Modeling Complex Aftereffect Behavior in Recording Materials Using a Preisach-Arrhenius Approach

Published online by Cambridge University Press:  10 February 2011

E. Della Torre ,
L. H. Bennett  and
L. J. Swartzendruber
E. Della Torre
Affiliation:
Also with the Institute for Magnetics Research, George Washington University, Washington, DC 20052
L. H. Bennett
Affiliation:
Also with the Institute for Magnetics Research, George Washington University, Washington, DC 20052
L. J. Swartzendruber
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

A Preisach-Arrhenius aftereffect model, that accurately calculates the entire relaxation process, including the linear log-time region, is used to describe some other characteristics of the time decay. The location of the peak of the decay coefficient is shown to be less than the peak of the irreversible coercivity by an amount that is a function of the standard deviation of the critical field, the fluctuating field, and the moving parameter. The model computes a magnetization decay that includes nonmonotonic behavior under certain circumstances, depending upon the applied field history. A conclusion of this paper is that procedures for accelerated testing of magnetic media are suspect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 517: Symposium F – Wide Bandgap Semiconductors for High Power, High Frequency , January 1998 , 291
Copyright
Copyright © Materials Research Society 1998

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References

1. Della Torre, E. and Bennett, L. H., IEEE Trans. Mag., Sep. 1998, (in press).Google Scholar
2. Néel, L., J Phys. Rad. 12, 339 (1951).10.1051/jphysrad:01951001203033900Google Scholar
3. Della Torre, E. and Vajda, F., J. Appl. Phys., 81 (8), 15 Apr. 1997, pp. 3815–3817.Google Scholar
4. Lou, J., Bennett, L. H. and Della Torre, E., IEEE Trans. Mag., Sep. 1998, (in press).Google Scholar
5. Yan, Y. D. and Della Torre, E., J. Appl. Phys. 66, 320 (1989).Google Scholar
6. Lyberatos, A. and Chantrell, R. W., J. Condens. Matter, 9, 2623 (1997).10.1088/0953-8984/9/12/010Google Scholar
7. LoBue, M., Basso, V., Bertotti, G., Muller, K.-H., IEEE Trans. Mag. 33, 3862 (1997).Google Scholar
8. Swartzendruber, L. J., Bennett, L. H., Della Torre, E., Brown, H. J. and Judy, J. H. in these proceedings.Google Scholar
9. Wohlfarth, E. P., J Phys. F. Met. Phys., 14, 1984, pp. L155–L159.10.1088/0305-4608/14/8/005Google Scholar