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Microstructure of YBCO and YBCO/SrTiO3/YBCO PLD Thin Films on Sapphire for Microwave Applications

Published online by Cambridge University Press:  10 February 2011

M. Lorenz ,
H. Hochmuth ,
D. Natusch ,
T. Thärigen ,
V. L. Svetchnikov ,
H. W. Zandbergen ,
C. Schäfer ,
G. Kästner  and
D. Hesse
M. Lorenz
Affiliation:
Universität Leipzig, Fakultät für Physik und Geowissenschaften, D-04103 Leipzig,Germany, [email protected]
H. Hochmuth
Affiliation:
Universität Leipzig, Fakultät für Physik und Geowissenschaften, D-04103 Leipzig,Germany, [email protected]
D. Natusch
Affiliation:
Universität Leipzig, Fakultät für Physik und Geowissenschaften, D-04103 Leipzig,Germany, [email protected]
T. Thärigen
Affiliation:
Universität Leipzig, Fakultät für Physik und Geowissenschaften, D-04103 Leipzig,Germany, [email protected]
V. L. Svetchnikov
Affiliation:
National Center for High Resolution Electron Microscopy, 2628 AL Delft, The Netherlands
H. W. Zandbergen
Affiliation:
National Center for High Resolution Electron Microscopy, 2628 AL Delft, The Netherlands
C. Schäfer
Affiliation:
Max-Planck-Institut für Mikrostrukturphysik, D-06120 Halle/Saale, Germany
G. Kästner
Affiliation:
Max-Planck-Institut für Mikrostrukturphysik, D-06120 Halle/Saale, Germany
D. Hesse
Affiliation:
Max-Planck-Institut für Mikrostrukturphysik, D-06120 Halle/Saale, Germany
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Abstract

A large-area pulsed laser deposition process for high-quality YBa2Cu3O7−δ (YBCO) thin films on both sides of R-plane sapphire substrates with CeO2 buffer layer is used routinely to optimize planar microwave filters for satellite and mobile communication systems. With the experience of more than 700 double-sided 3-inch diam. YBCO:Ag films a high degree of reproducibility of jc values above 3.5 MA/cm2 and of state of the art R5 values is reached. TEM cross sections of the large-area and double-sided PLD-YBCO:Ag thin films on R-plane sapphire with CeO2 buffer layers show typical defects like stress modulation, stacking faults, a-axis oriented grains, precipitates and interdiffusion layers. YBCO films on SrTiO3 / YBCO* / CeO2 film systems on R-plane sapphire wafers have more growth defects compared to bare CeO2 buffers on sapphire but show as microwave resonators encouraging electrical tunability.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 603: Symposium KK – Materials Issues for Tunable RF & Microwave Devices , 1999 , 163
Copyright
Copyright © Materials Research Society 2000

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