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Microstructural Characterization of Yttria-Doped Zirconia Coatings with Electron Microprobe Wavelength Dispersive Compositional Mapping

Published online by Cambridge University Press:  17 March 2011

Ryna B. Marinenko ,
Jennifer R. Verkouteren  and
David S. Bright
Ryna B. Marinenko
Affiliation:
National Institute of Standards and Technology, NIST, Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory Gaithersburg, MD 20899
Jennifer R. Verkouteren
Affiliation:
National Institute of Standards and Technology, NIST, Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory Gaithersburg, MD 20899
David S. Bright
Affiliation:
National Institute of Standards and Technology, NIST, Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory Gaithersburg, MD 20899
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Abstract

The use of digital electron microprobe x-ray compositional mapping with wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification of element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 645: Symposium M – Thermal Barrier Coatings-2000 , 2000 , M9.7.1
Copyright
Copyright © Materials Research Society 2001

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References

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