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Published online by Cambridge University Press: 10 February 2011
Cantilevers developed for atomic force microscopy can be used to construct sensitive thermal and stress sensors. We have shown how the stress changes which accompany deposition and desorption may be measured on single crystal electrodes. In this work we describe the surface stress changes associated with three processes: the electrodeposition of Pb and I and desorption of self assembled thiol monolayers on the Au(111) surface.