Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-08T00:00:22.651Z Has data issue: false hasContentIssue false

Metal-Parylene Interconnection Systems

Published online by Cambridge University Press:  15 February 2011

S. Dabral
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
X. Zhang
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
B. Wang
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
G.-R. Yang
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
T.-M Lu
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
J.F. McDonald
Affiliation:
Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12180. (Now at Intel Corp.; Now at Applied Materials)
Get access

Abstract

This paper reports the results of a study to integrate a metal-parylene interconnection system. The advantages and issues are highlighted. Fabrication steps for packaging geometries as well as proposed fabrication steps for VLSI applications are discussed. The relevant material properties for interconnection system design have been compiled.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. McDonald, J.F., Lin, H.T., Greub, H. J, Philhower, R.A., Dabral, S., IEEE-CHMT, Vol.12, No.2 June 1989, 195;&references there in.Google Scholar
2. Majid, N., Dabral, S., McDonald, J.F., J. Electron. Mater., Vol.18 No. 2 1989, 301; & references there in.Google Scholar
3. Dabral, S., Etten, J. Van, Zhang, X., Apblett, C., Yang, G.R., Ficalora, P. & McDonald, J.F., J. Electron. Mat., Vol.21, No. 10 1992, 989.Google Scholar
4. Dabral, S., Yang, G. R., Lu, T. M. and McDoanld, J.F., J. Vac. Sci. Technol. A 10(4), Jul/Aug, 1992 pp. 2764.Google Scholar
5. Dabral, S., Zhang, X., Wu, X.M., Yang, G.R., You, L., Lang, C.I., Hwang, K., Cuan, G., Chiang, C., Bakhru, H., Olson, R., Moore, J. A., Lu, T. M., McDonald, J.F., J. Vac. Sci Technol. B 11(5), Sep/Oct 1993, 1825.Google Scholar
6. Yang, G.R., Dabral, S., You, L., McDonald, J. F., Lu, T. M., Bakhru, H., J. Electron. Materials,Google Scholar
7. Yang, G.R., Dabral, S., Wu, X. M., Lu, T. M., and McDonald, J.F., J. Vac. Sci. Technol. A 10(4), Jul/Aug 1992, 916.Google Scholar
8. Zhang, X., Tacito, R., Yaney, D.S., Chiang, C., Steinbruchel, C., McDonald, J.F., Proc. IEEEVMIC, 1994, 87.Google Scholar
9. Zhang, X., You, L., Dabral, S., Chiang, C., Yaney, D.S., Joshi, R.V., Yang, G.R., Lu, T.M. and McDonald, J.F., ” Planarizing Techniques for Parylene As An Interlayer Dieelctric”, Proc. IEEEVMIC, 1993, 168.Google Scholar