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Measurement of Three Dimensional Polarization Direction in Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy with Rotating Electric Field

Published online by Cambridge University Press:  11 February 2011

Hiroyuki Odagawa  and
Yasuo Cho
Hiroyuki Odagawa
Affiliation:
Research Institute of Electrical Communication, Tohoku University, Sendai, 980–8577, Japan
Yasuo Cho
Affiliation:
Research Institute of Electrical Communication, Tohoku University, Sendai, 980–8577, Japan
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Abstract

A scanning nonlinear dielectric microscope (SNDM) probe, called theε311 -type probe, and a system to measure the ferroelectric polarization component parallel to the surface using rotating electric field have been developed. This is achieved by measuring the ferroelectric material's nonlinear dielectric constant ε311 instead of ε333, which is measured in conventional SNDM. Experimental result shows that we can successfully determine polarization component parallel to the surface. The SNDM system can measure polarization at any angle from the surface normal which is often of interest.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 748: Symposium U – Ferroelectric Thin Films XI , 2002 , U10.2
Copyright
Copyright © Materials Research Society 2003

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References

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