Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-02T23:17:39.701Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of Equilibrium and Nonequilibrium Segregation by X-Ray Microanalysis

Published online by Cambridge University Press:  25 February 2011

Edward A. Kenik
Edward A. Kenik*
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Get access

Abstract

X-ray microanalysis in an analytical electron microscope is a proven technique for the measurement of solute segregation in alloys. Solute segregation under equilibrium or nonequilibrium conditions can strongly influence material performance. X-ray microanalysis in an analytical electron microscope provides an alternative technique to measure grain boundary segregation, as well as segregation to other defects not accessible to Auger analysis. The utility of the technique is demonstrated by measurements of equilibrium segregation to boundaries in an antimony containing stainless steel, including the variation of segregation with boundary character and by measurements of nonequilibrium segregation to boundaries and dislocations in an ionirradiated stainless steel.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 62: Symposium Q – Materials Problem Solving with the Transmission Electron Microscope , 1985 , 209
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Pande, C. S., Suenaga, M., Vyas, B., Isaacs, H. S., and Harlings, D. F., Scripta Met. 11, 681 (1977).Google Scholar
[2] Hall, E. L. andBriant, C. L., Met. Trans. 15A, 793 (1984).Google Scholar
[3] Kenik, E. A., Scripta Met. 10, 733 (1976).Google Scholar
[4] Michael, J. R. and WiTTiams, D. B., Met. Trans. 15A, 99 (1984).Google Scholar
[5] Schneibel, J. H., White, C. L., Peterson, G. F., and Padgett, R. A., New Developments in Stainless Steel Technology, p. 61, ed., Lula, R. A., ASM, Metals Park, OH (1985).Google Scholar
[6] Reviewed in J. Nucl. Mater. 83, 1–237 (1979).Google Scholar
[7] Kenik, E. A., J. Nucl. Mater. 85&86, 659 (1979).CrossRefGoogle Scholar
[8] Bentley, J., Zaluzec, N. J., Kenik, E. A., and Carpenter, R. W., Scanning Electron Microscopy/1979, II, p. 581, SEM, Inc., AMF O'Hare, IL 60666, (1979).Google Scholar