Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-21T15:48:58.232Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetotransport Properties of Compression Molded CrO2-Polyimide Composite

Published online by Cambridge University Press:  01 February 2011

Sanjay R. Mishra ,
Kartik Ghosh ,
Joe Losby ,
Ted Kehl  and
Ann Viano
Sanjay R. Mishra
Affiliation:
Department of Physics, The University of Memphis, Memphis, TN
Kartik Ghosh
Affiliation:
Department of Physics, Astronomy, and Materials Science, Southwest MissouriState University, Springfield, MO
Joe Losby
Affiliation:
Department of Physics, The University of Memphis, Memphis, TN
Ted Kehl
Affiliation:
Department of Physics, Astronomy, and Materials Science, Southwest MissouriState University, Springfield, MO
Ann Viano
Affiliation:
Department of Physics, Rhodes College, Memphis, TN
Get access

Abstract

The conductivity and magnetotransport properties of compression molded half-metallic CrO2/Polyimide composites over a range of different metallic concentrations have been studied. The conductivity measurements on these composites show negative slope of resistance versus temperature. The magnetoresistance measurement indicates obvious enhancement at low temperatures. The maximum in magnetoresistance (MR) is found to be temperature and metal volume fraction dependent. Significant differences in high and low temperature magnetoresistive behavior in the composite have been observed. The high field, 15 T MR measurements show 23% and 19% MR enhancement at 5K and 75 K, respectively. Thus, it is found that the polymer barrier can contribute to enhancing magnetoresistive properties of the composite.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 847: Symposium EE – Organic/Inorganic Hybrid Materials , 2004 , EE13.23
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Coey, J. M. D., Berkowtiz, A. E., Balcells, Ll., Putris, F. F., and Barry, A., Phys. Rev. Lett. 80, 3815 (1998).Google Scholar
2. Huang, Yun-Hui; Chen, Xing; Wang, Zhe-Ming; Liao, Chun-Sheng; Yan, Chun-Hua; Zhao, Hong-Wu; Shen, Bao-Gen, J. Appl. Phys. 91, 7733 (2002).Google Scholar
3. Manoharan, S. S., Sahu, R. K., Elefant, D., Schneider, C. M., J. Appl. Phys. 91, 7923 (2002).Google Scholar
4. Sheng, P., Ables, B., and Arie, Y., Phys. Rev. Lett. 31, 44 (1973).Google Scholar
5. Mott, N. F., Conduction in Non-Crystalline Materials, Oxford University Press, New York, 1987.Google Scholar
6. Manoharan, S. S., Elefant, D., Reiss, G., and Goodenought, H. B., Appl. Phys. Lett. 72, 984 (1998).Google Scholar
7. Gupta, A., Li, X. W., and Xiao, G., J. Appl. Phys. 87, 6073 (2000).Google Scholar
8. Korotin, M. A., Anisimov, V. I., Khomskii, I. D., and Sawatzky, G. A., Phys. Rev. Lett. 80, 4305 (1998).Google Scholar