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Magnetic Force Microscopy Imaging of Current Paths

Published online by Cambridge University Press:  11 February 2011

R. Yongsunthon ,
A. Stanishevsky ,
P. J. Rous  and
E. D. Williams
R. Yongsunthon
Affiliation:
Department of Physics, University of Maryland, College Park, MD 20742
A. Stanishevsky
Affiliation:
MRSEC, University of Maryland, College Park, MD 20742
P. J. Rous
Affiliation:
Department of Physics, University of Maryland, Baltimore Country, MD 20742
E. D. Williams
Affiliation:
Department of Physics, University of Maryland, College Park, MD 20742
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Abstract

We demonstrate Magnetic Force Microscopy (MFM) imaging, at room temperature in air, of a 0.25mA DC current path in a 140nm-wide gold nanowire. The nanowire was created by focused ion beam milling of a 12μm wide Cr/Au line of 20nm/110nm Cr/Au thickness. Iterative fitting of the MFM data to an idealized model of the structure yielded a nanowire resistivity a factor of 3.5 higher than that of a control Cr/Au region which was unaffected by the ion beam processing. MFM imaging of an ion-implant patterned line shows current deflection around the implant region.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G5.6
Copyright
Copyright © Materials Research Society 2003

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References

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