Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Zybill, Christian
and
Petrova‐Koch, Vesselinka
1993.
Licht aus Silicium – Renaissance von Siloxen und Polysilan?.
Angewandte Chemie,
Vol. 105,
Issue. 6,
p.
887.
Enachescu, M.
Hartmann, E.
Kux, A.
and
Koch, F.
1993.
Surface structure imaging, electronically induced modifications and electroluminescence of porous silicon by scanning tunneling microscopy.
Journal of Luminescence,
Vol. 57,
Issue. 1-6,
p.
191.
Zybill, Christian
and
Petrova‐Koch, Vesselinka
1993.
Light from Silicon—Renaissance of Siloxene and Polysilane?.
Angewandte Chemie International Edition in English,
Vol. 32,
Issue. 6,
p.
845.
Kux, A.
and
Ben Chorin, M.
1994.
Photoluminescence Excitation Spectroscopy Of Porous Silicon.
MRS Proceedings,
Vol. 358,
Issue. ,
Li, K. -H.
Tsai, C.
Campbell, J. C.
Kovar, M.
and
White, J. M.
1994.
The effect of surface species on the photoluminescence of porous silicon.
Journal of Electronic Materials,
Vol. 23,
Issue. 4,
p.
409.
Allongue, Philippe
1995.
Advances in Electrochemical Science and Engineering.
Vol. 4,
Issue. ,
p.
1.
Fellah, S.
Wehrspohn, R.B.
Gabouze, N.
Ozanam, F.
and
Chazalviel, J.-N.
1998.
Photoluminescence quenching of porous silicon in organic solvents: evidence for dielectric effects.
Journal of Luminescence,
Vol. 80,
Issue. 1-4,
p.
109.
Wadayama, T
Arigane, T
Fujine, K
and
Hatta, A
1998.
Real-time photoluminescence and Raman spectral study of porous Si during F2 and H2O exposure.
Journal of Luminescence,
Vol. 78,
Issue. 2,
p.
111.
Chazalviel, J.-N.
and
Ozanam, F.
1998.
Surface Chemistry of Porous Silicon.
MRS Proceedings,
Vol. 536,
Issue. ,
Fellah, S.
Ozanam, F.
Gabouze, N.
and
Chazalviel, J.-N.
2000.
Porous Silicon in Solvents: Constant-Lifetime PL Quenching and Confirmation of Dielectric Effects.
physica status solidi (a),
Vol. 182,
Issue. 1,
p.
367.
Kolasinski, Kurt W.
2004.
Non-adiabatic and ultrafast dynamics of hydrogen adsorbed on silicon.
Current Opinion in Solid State and Materials Science,
Vol. 8,
Issue. 5,
p.
353.