Hostname: page-component-745bb68f8f-5r2nc Total loading time: 0 Render date: 2025-01-26T04:07:21.634Z Has data issue: false hasContentIssue false
  • English
  • Français

Luminance degradation and recovery studies in Alq3 based Organic light emitting diodes

Published online by Cambridge University Press:  21 March 2012

K. Sudheendra Rao ,
Girija S. Samal  and
Y. N. Mohapatra
K. Sudheendra Rao
Affiliation:
Department of Physics, Indian Institute of Technology, Kanpur-208016, India. Samtel Centre for Display Technologies, Indian Institute of Technology, Kanpur-208016, India
Girija S. Samal
Affiliation:
Samtel Centre for Display Technologies, Indian Institute of Technology, Kanpur-208016, India
Y. N. Mohapatra
Affiliation:
Department of Physics, Indian Institute of Technology, Kanpur-208016, India. Samtel Centre for Display Technologies, Indian Institute of Technology, Kanpur-208016, India Material Science Program, Indian Institute of Technology, Kanpur-208016, India.
Get access

Abstract

Though organic light emitting diodes are being commercialized in many applications, issues relating to lifetime and degradation remain as fundamental concerns limiting performance. A coherent understanding of degradation mechanisms is yet to emerge. We focus on intrinsic degradation of high quality Alq3 based diodes due to electrical stressing. We monitor progressive luminance degradation and recovery by introducing well defined relaxation time windows in the current stress cycles. The method helps to clearly distinguish between recoverable and permanent degradation systematically. The voltage shift due to degradation and recovery is also monitored as a function of time. Further, we introduce a method of reconstructing the transients of the recoverable part using progressive isolated current pulses as a probe. The recovery of degradation is related to the charging and discharging of the traps in the device and our method provides a technique of measuring significant parameters of trapping through luminance transients. The origin and distinguishing features of the two types of degradation are discussed.

Keywords

defectsorganicoptoelectronic
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1360: Symposium OO – Synthesis and Processing of Organic and Polymeric Materials for Semiconductor Applications , 2011 , mrss11-1360-oo10-70
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Popovic, Z.D., Aziz, H., IEEE Journal of Selected Topics in Quantum Electronics 8, 362 (2002).Google Scholar
2. Yamada, T., Zou, D., Jeong, H., Akaki, Y., and Tsutsui, T., Synthetic Metals 111, 237(2000).Google Scholar
3. Jeong, Hyein, Zou, Dechun, Tsutsui, Tetsuo and Ha, Chang-Sik, Thin Solid Films 363, 279 (2000).Google Scholar
4. Liao, L. S., Klubek, K. P., Madathil, J. K., Tang, C. W., and Giesen, D. J., Appl. Phys. Lett. 96, 043302 (2010).Google Scholar
5. Nga Ng, Tse, Silveira, William R., and Marohn, John A., Proc. SPIE 6336, 63360A (2006).Google Scholar
6. Zou, Dechun, Yahiro, Masayuki, and Tsutsui, Tetsuo, Appl. Phys. Lett. 72, 2484 (1998).Google Scholar
7. Kobrin, P., Fisher, R., and Gurrola, A., Appl. Phys. Lett. 85, 2385 (2004).Google Scholar
8. Zou, Dechun, Yahiro, Masayuki and Tsutsui, Tetsuo Jpn. J. Appl. Phys. 37, L1406 (1998).Google Scholar
9. Nakai, Masaya, Fujii, Hiroyuki, Tsujioka, Tsuyoshi, Hamada, Yuji and Takahashi, Hisakazu Jpn. J. Appl. Phys. 41, 881 (2002).Google Scholar
10. Roberts, Matthew, Asada, Kohei, Cass, Michael, Coward, Chris, King, Simon, Lee, Andrew, Pintani, Martina, Ramon, Miguel, and Foden, Clare, Proc. SPIE 7722, 77220C (2010).Google Scholar