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Low Temperature Studies Of Rare Gases Adsorbed On Molecular Sieve Materials

Published online by Cambridge University Press:  15 February 2011

Graham F. Mccann ,
I. Gameson ,
W.J. Steado ,
T. Rayment ,
P.J. Barrie  and
J. Klinowski
Graham F. Mccann
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
I. Gameson
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
T. Rayment
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
J. Klinowski
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
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Abstract

X-ray diffraction (XRD) and adsorption isotherms have long been traditional methods of characterising molecular sieves. By combining these techniques at low temperatures with variable temperature 129-Xe N.M.R. we now have a fuller understanding of the behaviour of sorbed layers inside these materials. In particular we have observed phase transformations of Xe in a polyhydroxyaluminium-pillared montmorillonite molecular sieve and have developed a model consistent with the data. In addition, using XRD, an interpillar distance of ca. 30Å was calculated. We present the first detailed low temperature studies of 129-Xe N.M.R. on these systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 233: Symposium U – Synthesis/Characterization and Novel Applications of Molecular Sieve Materials , 1991 , 273
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

[1] Pinnavaia, T.J., Science 220 365, (1983).Google Scholar
[2] Plee, D., Borg, F., Gatineau, L., Fripiat, J.J., J. Am. Chem. Soc. 107, 2362, (1985).Google Scholar
[3] Pinnavaia, T.J., Landau, S.D., Tzou, M., Johnston, I.D., J. Am. Chem. Soc. 107, 7222, (1985).Google Scholar
[4] Birgeneau, R.J., Horn, P.M., Science 232, 329, (1989).Google Scholar
[5] Gameson, I., Wright, P.A., Rayment, T., Thomas, J.M., Chem. Phys. Lett. 123, 145, (1986).Google Scholar
[6] Murray, R.S., Quirk, J.P., Langmuir 6 122, (1990).Google Scholar
[7] Barrie, P.J., Klinowski, J.: Submitted March 1991 to Prog. N.M.R. Spect..Google Scholar
[8] Fetter, G., Tichit, D., Menorval, L.C. De, Figueras, F., App. Catal. Lett. 65, (1990).CrossRefGoogle Scholar
[9] Gameson, I., PhD thesis, University of Cambridge, UK, 1987.Google Scholar
[10] Gameson, I., Stead, W.J., Rayment, T., J. Phys. Chem. 95. 1727, (1991).Google Scholar
[11] Ergun, S., J. Appl. Cryst. 3, 153, (1970).Google Scholar
[12] Pinnavaia, T.J., Rainey, V., Tzou, M.S., White, J.W., J. Mol. Catal. 27. 213, (1984).Google Scholar
[13] Fraissard, J., Ito, T., Zeolites 8. 350, (1988).Google Scholar