Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T09:06:57.200Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy Atom Scattering Spectroscopy for Insulator Surface Analysis: MgO(111) Surfaces

Published online by Cambridge University Press:  25 January 2013

K. Umezawa
K. Umezawa*
Affiliation:
Dept. of Physics, College of Integrated Arts & Sciences, Osaka Prefecture University, 1-1 Gakuen-Cho, Sakai, Osaka 599-8531, Japan
Get access

Abstract

This study described a low-energy atom scattering system combined with a time-of-flight spectrometer and an ultra high vacuum chamber for insulator surface structural analysis. We show one of examples to study of MgO(111) surface analysis. A visual image of Mg atoms due to the projected blocking pattern represents the crystalline structure of the MgO(111) surfaces. This figure shows the trajectory of scattered 4He0 particles due to Mg atoms along low-index lattice planes and crystallographic directions. Insulator surface structural analysis becomes more important in materials sciences.

Keywords

insulatorMgion scattering spectroscopy (ISS)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1531: Symposium YY – Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization , 2013 , mrsf12-1531-yy03-05
Copyright
Copyright © Materials Research Society 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Feldman, L. C, Mayer, J. W., Fundamentals of Surface and Thin Film Analysis, (North-Holland, 1986).Google Scholar
Umezawa, K., Nakanishi, S., Hayashi, H., Higashitsutsumi, H., Nagasawa, H., Ogai, K., MRS online proceeding library, 2011, vol. 1318, mrsf10-1318-ss05-05.Google Scholar
Smith, D. P., J. Appl. Phys. 38, 340 (1967).CrossRefGoogle Scholar
Katayama, M., Nomura, E., Kanekuma, N., Soejima, H., Aono, M., Nucl. Instr. Meth. B 33, 857 (1988).CrossRefGoogle Scholar
Sumitomo, K., Oura, K., Katayama, I., Shoji, F., Hanawa, T., Nucl. Instrum. Meth. B 33, 871 (1988).CrossRefGoogle Scholar
Yoshimoto, M., Maeda, T.,Shimozono, K., Koinuma, H., Shinohara, M., Ishiyama, O. and Ohtani, F., Appl. Phys. Lett. 65, 3197 (1994).CrossRefGoogle Scholar
Umezawa, K., Nakanishi, S., Kojima, K., Yoshimura, M., Ueda, K., Gibson, W. M., Phys. Rev. B 63, 035402 (2001).CrossRefGoogle Scholar
Rabalis, J. W., Low Energy Ion Surface Interactions, (Wiley, 1994).Google Scholar
Moliére, G., Naturforsch, Z.. Teil A 2 (1947) 133.Google Scholar
Firsov, O. B., Sov. Phys, JETP 6 (1958) 534.Google Scholar