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Low Cost Scalable Self-Assembly of Silver Nanowire Thin Films for Surface Enhanced Raman Scattering Application

Published online by Cambridge University Press:  04 February 2014

Changfeng Chen ,
Jumin Hao ,
Leyun Zhu ,
Yuqin Yao  and
Qingwu Wang
Changfeng Chen
Affiliation:
Nanotrons Corporation, 15 Presidential Way, Woburn, MA, USA
Jumin Hao
Affiliation:
Nanotrons Corporation, 15 Presidential Way, Woburn, MA, USA
Leyun Zhu
Affiliation:
Nanotrons Corporation, 15 Presidential Way, Woburn, MA, USA
Yuqin Yao
Affiliation:
Nanotrons Corporation, 15 Presidential Way, Woburn, MA, USA
Qingwu Wang
Affiliation:
Nanotrons Corporation, 15 Presidential Way, Woburn, MA, USA
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Abstract

Assembly of nanowires into ordered macroscopic structures has attracted great scientific interests in the past decade. In this work, we report a rapid low-cost scalable oil-water interfacial self assembly process for fabricating aligned Ag nanowires (AgNWs) films on solid substrates. This process is much simpler than the traditional Langmuir-Blodgett (LB) techniques and allows the assembly of one–dimensional Ag nanowires onto any solid substrates without extra pretreatment of the surface of silver nanowires or the solid substrate. The present aligned AgNW films can serve as robust surface-enhanced Raman scattering (SERS) sensors for chemical and bimolecular detection with improved spectra quality and demonstrated uniformity of SERS signal using R6G dye as probe.

Keywords

thin filmself-assemblyRaman spectroscopy
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1659: Symposium SS/XX – Micro- and Nanoscale Systems – Novel Materials, Structures and Devices , 2014 , pp. 219 - 224
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Freer, E. M., Grachev, O., Duan, X., Martin, S., and Stumbo, D. P., Nat Nano. 5, 525–530 (2010).CrossRefGoogle Scholar
Chang, S., Ko, H., Gunawidjaja, R., and Tsukruk, V. V., The Journal of Physical Chemistry C. 115, 4387–4394 (2011).CrossRefGoogle Scholar
Gunawidjaja, R., Ko, H., Jiang, C. Y., and Tsukruk, V. V., Chemistry of Materials. 19, 2007–2015 (2007).CrossRefGoogle Scholar
Liu, J.-W., Wang, J.-L., Huang, W.-R., Yu, L., Ren, X.-F., Wen, W.-C., and Yu, S.-H., Sci. Rep. 2, 987 (2012).CrossRefGoogle Scholar
Huang, Y., Duan, X., Wei, Q., and Lieber, C. M., Science. 291, 630–633 (2001).CrossRefGoogle Scholar
Shi, H. Y., Hu, B., Yu, X. C., Zhao, R. L., Ren, X. F., Liu, S. L., Liu, J. W., Feng, M., Xu, A. W., and Yu, S. H., Advanced Functional Materials. 20, 958–964 (2010).CrossRefGoogle Scholar
Zhang, S.-Y., Liu, J.-W., Zhang, C.-L., and Yu, S.-H., Nanoscale. 5, 4223–4229 (2013).CrossRefGoogle ScholarPubMed
Tao, A., Kim, F., Hess, C., Goldberger, J., He, R., Sun, Y., Xia, Y., and Yang, P., Nano Letters. 3, 1229–1233 (2003).CrossRefGoogle Scholar
Chen, M., Phang, I. Y., Lee, M. R., Yang, J. K. W., and Ling, X. Y., Langmuir. 29, 7061–7069 (2013).CrossRefGoogle Scholar
Chen, C., Hao, J., Zhu, L., Yao, Y., Meng, X., Weimer, W., and Wang, Q. K., Journal of Materials Chemistry A. 1, 13496–13501 (2013).CrossRefGoogle Scholar
Tao, A. R. and Yang, P., J. Phys. Chem. B. 109, 15687–15690 (2005).CrossRefGoogle Scholar
Duan, H. W., Wang, D. Y., Kurth, D. G., and Mohwald, H., Angewandte Chemie-International Edition. 43, 5639–5642 (2004).CrossRefGoogle Scholar
Lee, S. J., Morrill, A. R., and Moskovits, M., Journal of the American Chemical Society. 128, 2200–2201 (2006).CrossRefGoogle Scholar
Kottmann, J. and Martin, O., Opt. Express. 8, 655–663 (2001).CrossRefGoogle Scholar
Mohanty, P., Yoon, I., Kang, T., Seo, K., Varadwaj, K. S. K., Choi, W., Park, Q. H., Ahn, J. P., Suh, Y. D., Ihee, H., and Kim, B., Journal of the American Chemical Society. 129, 9576–9577 (2007).CrossRefGoogle Scholar
Goh, M. S., Lee, Y. H., Pedireddy, S., Phang, I. Y., Tjiu, W. W., Tan, J. M. R., and Ling, X. Y., Langmuir. 28, 14441–14449 (2012).CrossRefGoogle Scholar
Liu, G. L. and Lee, L. P., Applied Physics Letters. 87, 074101–074101-3 (2005).CrossRefGoogle Scholar
Nikoobakht, B., Wang, J., and El-Sayed, M. A., Chem. Phys. Lett. 366, 17–23 (2002).CrossRefGoogle Scholar
Hao, J., Xu, Z., Han, M.-J., Xu, S., and Meng, X., Colloid Surface A. 366, 163–169 (2010).CrossRefGoogle Scholar