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Loss Measurements of Stoichiometric Ti and O Implanted LiNbO3 Waveguides

Published online by Cambridge University Press:  21 February 2011

E. K. Williams ,
D. Ila ,
S. Sarkisov ,
P. Venkateswarlu  and
D. B. Poker
E. K. Williams
Affiliation:
Center for Irradiation of Materials, P.O Box 1447
D. Ila
Affiliation:
Center for Irradiation of Materials, P.O Box 1447
S. Sarkisov
Affiliation:
Center for Nonlinear Optics, Alabama A&M University, Normal, AL 35762, U. S. A.
P. Venkateswarlu
Affiliation:
Center for Nonlinear Optics, Alabama A&M University, Normal, AL 35762, U. S. A.
D. B. Poker
Affiliation:
Solid State Division of Oak Ridge National Laboratory, P.O Box 2008, MS 6048, Oak Ridge, TN 37831, U. S. A.
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Abstract

Planar waveguides created by the implantation at 500°C of 2.5 x 1017 Ti ions/cm2 and 7.5 x 1017 O ions/cm2 have been characterized for loss by the scattered light technique. Preliminary results indicate losses of less than 2.5 dB/cm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 396: Symposium A – Ion-Solid Interactions for Materials Modification and Processing , 1995 , 361
Copyright
Copyright © Materials Research Society 1996

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