Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-02T18:46:02.119Z Has data issue: false hasContentIssue false
  • English
  • Français

Long-Term Reliability of Silica-Based Planar Lightwave Circuit Devices

Published online by Cambridge University Press:  10 February 2011

H. Hanafusa ,
S. Sumida  and
N. Takato
H. Hanafusa
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, [email protected]
S. Sumida
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, [email protected]
N. Takato
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, [email protected]
Get access

Abstract

We describe the results of accelerated lifetests performed on silica-based planar lightwave circuit (PLC) devices. Specifically, we tested PLC splitter modules in damp heat environments with different temperatures and humidities. The time-to-failure data of the splitter samples were analyzed by using the Weibull distribution, and the shape parameter was derived as 1.77. Moreover, the temperature and humidity dependence of the median life e was analyzed by using the equation

and the coefficients E and n were determined to be 1.49 eV and 3.70, respectively. The thirtyyear hazard rate is estimated to be less than 40 FIT for PLC splitter modules operating at 60°C/ 40% RH.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 349
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Gadonna, M., Draycott, T. and Gundersen, S., Proc. 13th Ann. Conf. on European Fiber Optic Communications and Networks, p. 65 (1995).Google Scholar
2. Kawachi, M., Opt. Quantum Electron., 22, p. 391 (1990).10.1007/BF02113964Google Scholar
3. Kobayashi, S., Kitoh, T., Hida, Y., Suzuki, S. and Yamaguchi, M., Electron. Lett., 26, p. 707 (1990).Google Scholar
4. Hanafusa, H., Takato, N., Hanawa, F., Oguchi, T., Suda, H. and Ohmori, Y., Electron. Lett., 28, p. 644 (1992).10.1049/el:19920407Google Scholar
5. Hibino, Y., Hanawa, F., Nakagome, H., Ishii, M. and Takato, N., J. Lightwave Technol., 13, p. 1728 (1995).10.1109/50.405317Google Scholar
6. Hanafusa, H., Hanawa, F., Hibino, Y. and Nozawa, T., Electron. Lett., 33, p. 238 (1997).10.1049/el:19970138Google Scholar
7. Bellcore, , Technical Advisory, TA-NWT-001221, 1993.Google Scholar
8. Nelson, W., Accelerated testing, Wiley & Sons, Inc., New York, 1990, pp. 64.Google Scholar
9. Osenbach, J.W. and Evanosky, T.L., J. Lightwave Technol., 14, p. 1865 (1996). 358Google Scholar