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Investigations of Ultra-Thin Single Layer A-Si:H Films

Published online by Cambridge University Press:  15 February 2011

S. A. Koehler
S. A. Koehler*
Affiliation:
The James Frank Institute, University of Chicago, Chicago IL 60637
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Abstract

Measurements are presented as direct evidence of tail states in ultra-thin a-Si:H single layer films. Including tail states in computer simulations completely removes the staircase structure in the differential optical spectra, previously associated with the quantum confinement of carriers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 467: Symposium A – Amorphous and Microcrystalline Silicon Technology - 1997 , 1997 , 549
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1 Tiedje, T., Mat. Res. Symp. Proc. 49, 121 ( 1985 ).Google Scholar
2 Abeles, B. and Tiedje, T., Phys. Rev. Lett. 51, 2003 (1983).Google Scholar
3 Beaudoin, M., Meunier, M., and Arsenault, C. J., Phys Rev. B 47, 2197 (1993).Google Scholar
4 Hattori, K., Mori, T., Okamato, H., and Hamakawa, Y., Appl. Phys. Lett. 53, 2170 (1988).Google Scholar
5 Chen, K., Xu, J., Zhou, L., Jiang, J., Li, Z., and Du, J., Chinese Phys. Lett. 8, 432 (1991).Google Scholar
6 Koehler, S., and Fritzsche, H., Mat. Res. Symp. Proc., 420, 741 ( 1996 ).Google Scholar
7 Matsuda, A. and Tanaka, K., J. of Non-Cryst. Solids 97&98, 1367 (1987).Google Scholar
8 Baker, S. H., Spear, W. E., and Gibson, R. A. G., Phil. Mag. B 62, 213 (1990).Google Scholar
9 Lu, Y., An, I., Gunes, M., Wakagi, M., Wronski, C., and Collins, R., App. Phys. Lett. 63, 2228 (1993).Google Scholar
10 Li, Y., An, I., Nguyen, H., Wronski, C., and Collins, R., Phys. Rev. Lett. 68, 2814 (1992).Google Scholar
11 Stutzin, G. C., Ostrom, R. M., and Gallagher, A., J. Appl. Phys. 74, 91 (1993).Google Scholar
12 Azuma, M., Nakamura, K., Yokoi, T., Yoshino, T., and Shimizu, I., Mat. Res. Soc. Symp. Proc. 377, 191 (1995).Google Scholar
13 For a description of PDS see Jackson, W. B., Amer, N. M., Boceara, A. C., and Fournier, D., Applied Optics 20, 1333 (1981).Google Scholar
14 Li, Y., An, I., Nguyen, H., Wronski, C., and Collins, R., Phys. Rev. Lett. 68, 2814 (1992).Google Scholar
15 Wang, W. and Fritzsche, H., in Amorphous Silicon and Related Materials, edited by Hellmut Fritzsche (World Scientific, Singapore, 1988 ) p. 788.Google Scholar
16 Raikh, M., Baronovskii, S., and Shklovskii, B., Phys. Rev. B 41, 7701 (1990).Google Scholar