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Investigations of Ultra-Thin Single Layer A-Si:H Films

Published online by Cambridge University Press:  15 February 2011

S. A. Koehler
S. A. Koehler*
Affiliation:
The James Frank Institute, University of Chicago, Chicago IL 60637
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Abstract

Measurements are presented as direct evidence of tail states in ultra-thin a-Si:H single layer films. Including tail states in computer simulations completely removes the staircase structure in the differential optical spectra, previously associated with the quantum confinement of carriers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 467: Symposium A – Amorphous and Microcrystalline Silicon Technology - 1997 , 1997 , 549
Copyright
Copyright © Materials Research Society 1997

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References

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