Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-02T23:44:47.786Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of Porous Silicon Films Structure by Optical Methods

Published online by Cambridge University Press:  28 February 2011

P. Basmaji ,
V. Grivickas ,
G. I. Surdutovich ,
R. Vitlina  and
V. S. Bagnato
P. Basmaji
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
V. Grivickas
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
G. I. Surdutovich
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
R. Vitlina
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
V. S. Bagnato
Affiliation:
Institute de Física e Química de Säo Carlos - USP, Sao Carlos, SP, 13560–970, Brazil
Get access

Abstract

The structure of aged porous silicon (PS) has been investigated using reflectivity, photoluminescence (PL), optical absorption and photoconductivity decay. An optical anisotropy in a perpendicular to surface direction is observed for PS samples below a critical porosity of 70%. The photostability of the PL spectra imply three different structures of PS, these should be attributed to quantum size structures, polymeric type structures and fluor-related structures. The absorption edge is deconvoluted into a band-to-band absorption with energy ranging between Eg = 1.6–2 eV and an absorption shoulder at hu ≤ Eg. The high energy PL band around 2.3 eV resembles that of fluoroindate glass. The observed rapid lifetime at high injection level is attributed to excitonic Auger-type recombination.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 283: Symposium F – Microcrystalline Semiconductors–Materials Science and Devices , 1992 , 227
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Canham, L., Phys. World 41, March (1992).Google Scholar
[2] Fuchs, H.D., Stutzmann, M., Brandt, M.S., Rosenbauer, M., Weber, J. and Cardona, M., Physica Scripta T 45, 309 (1992).Google Scholar
[3] Grivickas, V. and Basmaji, P., submitted to Appl. Phys. Lett.Google Scholar
[4] Buda, F., Kohanoff, J. and Parrinello, M., Phys. Rev. Lett. 69, 1272 (1992).Google Scholar
[5] Cardoso, C.X., Messaddeq, Y., Nunes, L.A.O. and Aegerter, M.A. - Proc. of 8th Int. Symp. of Halide Glasses, Perrus-Guiree, France, 1992 (in press).Google Scholar
[6] Yota, J. and Burrows, V.A., J. Appl. Phys. 69, 7369 (1991).Google Scholar
[7] Koshida, N. and Koyama, H., Appl Phys. Lett. 60, 347 (1992).Google Scholar