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Interference of Electron Waves on Carbon Nanotubes at Room Temperature

Published online by Cambridge University Press:  15 March 2011

A. Hassanien*
Affiliation:
Nanotechnology Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
P. Umek
Affiliation:
Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
D. Vrbanic
Affiliation:
Faculty of Chemistry and Chemical Technology, University of Ljubljana, Askerceva 5, 1000 Ljubljana, Slovenia
M. Mozetic
Affiliation:
Institute of Surface Engineering and Optoelectronics, Teslova 30, 1000 Ljubljana, Slovenia
P. Venturini
Affiliation:
National Institute of Chemistry, Hajdrihova 19, 1000 Ljubljana, Slovenia
M. Tokumoto
Affiliation:
Nanotechnology Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
D. Mihailovic
Affiliation:
Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
S. Pejovnik
Affiliation:
Faculty of Chemistry and Chemical Technology, University of Ljubljana, Askerceva 5, 1000 Ljubljana, Slovenia
*
*Requests and correspondence should be addressed to A.H.; electronic mail: [email protected]
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Abstract

We report on the structure and electronic properties of single wall carbon nanotubes (SWNTs) tips with atomically spatial resolution. Scanning tunneling microscopy (STM) show topographic images of closed tips with a variety of geometrical structure; these include round, conical, as well as tips with a messy shape. At low bias voltage, topographic STM images show standing wave pattern of the charge density in the vicinity of nanotube ends. The patterns originate from constructive interference between the electronic states and its reflection on the nanotube tips. The modulations extend along 6-8 nm away from the cap. Atomically resolved images show asymmetry in the charge density that smears out as the bias voltage increases. These distinctive tip states do not exist elsewhere on the tube and are related to the presence of topological defects at tube ends.

Type
Article
Copyright
Copyright © Materials Research Society 2002

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References

1. Dresselhaus, M. S., Dresselhaus, G. and Eklund, P. C., Science of Fullerenes and Carbon Nanotubes (Academic Press, San Diego, 1996).Google Scholar
2. Wildoer, Jeroen W. G., Venema, Liesbeth C., Rinzler, Andrew G., Smalley, Richard E. and Dekker, Cees, Nature 391, 59 (1998).Google Scholar
3. Odom, Teri Wang, Huang, Jin-Lin, Kim, Philip, and Lieber, Charles M., Nature 391, 62 (1998).Google Scholar
4. Hassanien, A., Tokumoto, M., Kumazawa, Y., Kataura, H., Maniwa, Y., Suzuki, S. and Achiba, Y., Appl. Phy. Lett. 73, 3839 (1998).Google Scholar
5. Hassanien, A., Tokumoto, M. Ohshima, S., Kuriki, Y., Ikazaki, F., Uchida, K., Yumura, M., Appl. Phys. Lett, 75, 2755 (1999).Google Scholar
6. Saito, Y., Hamaguchi, K., Uemura, S., Uchida, K., Tasaka, Y., Ikazaki, F., Yumura, Y., Kasuya, A., and Nishina, Y., Appl. Phys. A 67, 95 (1998).Google Scholar
7. Trans, Sander J., Verschueren, Alwin R. M. and Dekker, Cess, Nature 393, 49 (1998).Google Scholar
8. Venema, L. C., Wildöer, J. W. G., Tans, S. J., Janssen, J. W., Hinne, L. J., Tuinstra, T., Kouwenhoven, L. P., and Dekker, C., Science 283, 52 (1999).Google Scholar
9. Rubio, A., Sánchez-Portal, D., Artacho, E., Ordejón, P., and Soler, J. M., Phys. Rev. Lett. 82, 3520 (1999).Google Scholar
10. Hasegawa, Y., and Avouris, Ph., Phys. Rev. Lett. 71, 1071 (1993).Google Scholar
11. Umek, P., Hassanien, A., Tokumoto, M., and Mihailovic, D., Carbon, 38: (11-12) 1723 (2000).Google Scholar
12. Mozetic, M., Vacuum 61: (2-4) 367371 (2001).Google Scholar
13. Liang, Wenjie, Bockrath, Marc, Bozovic, Dolores, Hafner, Jason H., Tinkham, M. and Park, Hongkun, Nature 411, 665 (2001).Google Scholar