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Interfacial Control of Creep Deformation in Ultrafine Lamellar TiAl

Published online by Cambridge University Press:  11 February 2011

L. M. Hsiung
L. M. Hsiung*
Affiliation:
University of California, Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, CA 94551–9900, U.S.A.
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Abstract

Solute effect on the creep resistance of two-phase lamellar TiAl with an ultrafine microstructure creep-deformed in a low-stress (LS) creep regime [where a nearly linear creep behavior was observed] has been investigated. The resulted deformation substructure and in-situ TEM experiment reveals that interface sliding by the motion of pre-existing interfacial dislocations is the predominant deformation mechanism in LS creep regime. Solute segregation at interfaces and interfacial precipitation caused by the segregation result in an increase of creep resistance in LS creep regime.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 740: Symposium I – Nanomaterials for Structural Applications , 2002 , I8.9
Copyright
Copyright © Materials Research Society 2003

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