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Interdiffusion, Crystallinity and Exchange Bias in MnxPt1-x/Co Bilayers

Published online by Cambridge University Press:  10 February 2011

Erie H. Morales ,
Yikuan Wang  and
D. Lederman
Erie H. Morales
Affiliation:
Department of Physics, West Virginia University, Morgantown WV 26506–6315
Yikuan Wang
Affiliation:
Department of Physics, West Virginia University, Morgantown WV 26506–6315
D. Lederman
Affiliation:
Department of Physics, West Virginia University, Morgantown WV 26506–6315
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Abstract

The structure of the antiferromagnet (AF) in the Ta/ MnxPt1-x/Co /Ta system must have the face-centered tetragonal CuAu structure in order to obtain a measurable exchange bias (HE). The formation of this structure has an onset temperature of approximately 240 °C. Increasing the annealing temperature increases the amount of CuAu ordering, which increases HE, and also increases the MnPt/Co interdiffusion, which decreases HE. These two competing processes result in an optimum annealing temperature that maximizes HE.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 746: Symposia Q/R – Magnetoelectronics-Novel Magnetic Phenomena in Nanostructures – Advanced Characterization of Artificially Structured Magnetic Materials , 2002 , R1.1
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Meicklejohn, and Bean, C. P., Phys. Rev. 102, 1413 (1956).Google Scholar
2. Dieny, B., Spreriosu, V. S., Metin, S., Parkin, S. S. P., Gurney, B. A., Baumgart, P. and Wilhoit, D. R., J. Appl. Phys. 69, 4774 (1991).Google Scholar
3. Mauri, D., Siegmann, H.C., Bagus, P.S. and Kay, E., J. Appl. Phys. 62 (7), 1987.Google Scholar
4. Charlton, T., McChesney, J., Lederman, D., Zhang, F., Hilt, J.Z. and Pechan, M.J., Phys. Rev. B 59, 11897 (1999).Google Scholar
5. Vidal, B. and Vincent, P., Apl. Opt. 23, 1794 (1984).Google Scholar
6. Krén, E., Kádár, G., Pál, L., Sólyom, J., Szabó, P. and Tarnóczi, T., Phys. Rev. 171, 574 (1968).Google Scholar
7. Honda, S., Nawate, M. and Norikane, T., J. Magn. Magn. Mater. 220, 85 (2000).Google Scholar
8. Morales, Erie H., Wang, Y. and Lederman, D., Kellock, A. J. and Carey, M. J. (unpublished).Google Scholar