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Published online by Cambridge University Press: 26 February 2011
The passivation by hydrogen of the shallow donors sulfur, selenium, and tellurium in GaAs was studied by infrared absorption spectroscopy (FTIR), capacitance-voltage (CV) depth profiling, and secondary ion mass spectroscopy (SIMS). Local vibrational mode (LVM) frequencies due to hydrogen-donor complexes agree with a microscopic model where the hydrogen atom is bound in the antibonding position to one of the donor’s neighboring gallium atoms. Our results suggest a hydrogen penetration depth much greater than the passivated region, however the infrared active region coincides with the passivated part of the material.