Hostname: page-component-745bb68f8f-grxwn Total loading time: 0 Render date: 2025-02-04T18:03:23.541Z Has data issue: false hasContentIssue false
  • English
  • Français

Instability Induced by Near-substrate Electric Field

Published online by Cambridge University Press:  15 March 2011

David Salac  and
Wei Lu
David Salac
Affiliation:
Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI 48109, USA
Wei Lu
Affiliation:
Department of Mechanical Engineering, University of Michigan, Ann Arbor, MI 48109, USA
Get access

Abstract

This paper reports experimental work using an electric field close to a substrate to induce morphological patterns in a thin polymer film. The film was spin-coated onto a glass wafer, and subsequently heated to above its glass transition temperature to allow viscous flow. An electric field was applied by two parallel electrodes spacing 10 mm apart. The initially flat polymer/air interface lost stability and formed islands. The self-assembled islands exhibited a narrow size distribution and demonstrated spatial ordering. We attribute the pattern formation to the minimization of combined interface energy and electrostatic energy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 821: Symposium P – Nanoscale Materials & Modeling-Relations Among Processing, Microstructure and Mechanical Properties , 2004 , P3.31
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Liu, T. B., Burger, C., and Chu, B., Prog Polym Sci. 28, 5 (2003).Google Scholar
2 Xia, Y., Rogers, J. A., Paul, K. E. and Whitesides, G. M., Chem. Rev. 99, 1823 (1999).Google Scholar
3 Chou, S.Y. and Zhuan, L., J. Vac. Sci Technol. 17, 3197 (1999).Google Scholar
4 Chou, S. Y., Zhuang, L., and Guo, L. J., Appl. Phys. Lett. 75, 1004 (1999).Google Scholar
5 Schäffer, E., Thurn-Albrecht, T., Russell, T. P., and Steiner, U., Nature 403, 874 (2000).Google Scholar
6 Morariu, M. D., Voicu, N. E., Schaffer, E., Lin, Z.Q., Russell, T.P., and Steiner, U., Nature Materials 2, 48 (2003).Google Scholar
7 Scháffer, E., Thurn-Albrecht, T., Russell, T. P., and Steiner, U., Europhys. Lett. 53, 518 (2001).Google Scholar
8 Suo, Z. and Liang, J., Appl. Phys. Lett. 78, 3971 (2001).Google Scholar
9 Wu, L. and Chou, S. Y., Appl. Phys. Lett. 82, 3200 (2003).Google Scholar
10 Vrij, A., Faraday Soc 42, 23 (1966).Google Scholar