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Indium Gallium Arsenide Based Non-Volatile Memory Devices with Site-Specific Self-Assembled Germanium Quantum Dot Gate

Published online by Cambridge University Press:  01 February 2011

Pik-Yiu Chan ,
Mukesh Gogna ,
Ernesto Suarez ,
Fuad Alamoody ,
Supriya Karmakar ,
Barry Miller ,
John Ayers  and
Faquir Jain
Pik-Yiu Chan
Affiliation:
[email protected], University of Connecticut, Electrical and Computer Engineering, Storrs, Connecticut, United States
Mukesh Gogna
Affiliation:
[email protected], University of Connecticut, Electrial & Computer Engineering, Storrs, Connecticut, United States
Ernesto Suarez
Affiliation:
[email protected], University of Connecticut, Electrical and Computer Engineering, Storrs, Connecticut, United States
Fuad Alamoody
Affiliation:
[email protected], University of Connecticut, Electrial & Computer Engineering, Storrs, Connecticut, United States
Supriya Karmakar
Affiliation:
[email protected], University of Connecticut, Electrical and Computer Engineering, Storrs, Connecticut, United States
Barry Miller
Affiliation:
[email protected], University of Connecticut, Electrical and Computer Engineering, Storrs, Connecticut, United States
John Ayers
Affiliation:
[email protected], University of Connecticut, Electrical and Computer Engineering, Storrs, Connecticut, United States
Faquir Jain
Affiliation:
[email protected], University of Connecticut, Electrial & Computer Engineering, Storrs, Connecticut, United States
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Abstract

This paper presents the implementation of indium gallium arsenide field-effect transistors (InGaAs FETs) as non-volatile memory using lattice-matched II-VI gate insulator and quantum dots of GeOx-cladded Ge as the floating gate. Studies have been done to show the ability of II-VI materials to act as a tunneling gate material for InGaAs based FETs, and GeOx-cladded Ge quantum dots having the ability to store charges in the floating gate of a memory device. Proposed structure of the InGaAs device is presented.

Keywords

memoryself-assemblyII-VI
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1250: Symposium G – Materials and Physics for Nonvolatile Memories II , 2010 , 1250-G01-05
Copyright
Copyright © Materials Research Society 2010

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References

1 Jain, F.C., Suarez, E., Gogna, M., Al-Amoody, F., Butkiewicus, D., Hohner, R., Liaskas, T., Karmakar, S., Chan, P.-Y., Miller, B., Chandy, J., and Heller, E., J. Electron. Mater. 38, 1574 (2009).10.1007/s11664-009-0755-xGoogle Scholar
2 Tiwari, S., Rana, F., Chan, K., H, Hanafi, Chan, W., and Buchanan, D., IEDM Proc., 521 (1995).Google Scholar
3 Jain, F.C., Heller, E., Karmakar, S., and Chandy, J., Proc. International Semiconductor Device Research Symposium, Dec. 12–15, College Park, MD (2007).Google Scholar
4 Velampati, R. and Jain, F.C., NSTI Nanotech, Santa Clara, CA, May 20–24 (2007).Google Scholar
5 Gogna, M., Al-Amoody, F., Karmakar, S., Papadimitrakopoulos, F., and Jain, F., Proc. Nanoelectron Devices for Defense and Security Conference, Sept 28 – Oct 2, Fort Lauderdale, FL (2009)Google Scholar
6 Hasaneen, E.-S., Heller, E., Bansal, R., and Jain, F., Solid State Electron. 48, 2055 (2004).10.1016/j.sse.2004.05.073Google Scholar