Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-29T10:11:49.823Z Has data issue: false hasContentIssue false
  • English
  • Français

Indentation Modulus and Yield Point of Au (111), (001), and (110)

Published online by Cambridge University Press:  10 February 2011

J. D. Kiely  and
J. E. Houston
J. D. Kiely
Affiliation:
Surface and Interface Sciences Department, MS 1413 Sandia National Laboratories, Albuquerque, NM 87185-1413
J. E. Houston
Affiliation:
Surface and Interface Sciences Department, MS 1413 Sandia National Laboratories, Albuquerque, NM 87185-1413
Get access

Abstract

Nanoscale indentation experiments were performed on Au using the Interfacial Force Microscope (IFM) in an indentation mode. The indentation modulus and yield point were measured for three orientations of the Au surface: (111), (110), and (001). The indentation modulus for the (111) surface was found to be 36% greater than for the (001) surface and only 3% higher than the (110) surface. Additionally, the yield point was found to vary between orientations, but the shear stress resolved on {111} slip planes beneath the indenter on the axis of symmetry was found to be approximately 1.8 GPa for yield points of all three orientations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 522: Symposium T – Fundamentals of Nanoindentation & Nanotribology , 1998 , 125
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Michalske, T. A.and Houston, J. E., Acta Materialia 46, 391–396 (1998).Google Scholar
[2] Hsu, T. and Cowley, J. M., Ultramicroscopy 11,239 (1983).Google Scholar
[3] Schneir, J., Sonnenfeld, R., Marti, O., Hansma, P. K., Demuth, J. E.and Hamers, R. J., J. Appl. Phys. 63, 717–721 (1988).Google Scholar
[4] Thomas, R. C., Houston, J. E., Michalske, T. A. and Crooks, R. M., Science 259, 1883 (1993).Google Scholar
[5].Houston, J. E., Michalske, T. A. and Crooks, R. M. Interfacial Adhesion at the Molecular Level in 20th Annual Meeting of the Adhesion Society. (1997). Hilton-Head, SC: The Adhesion Society.Google Scholar
[6].Joyce, S. A., Thomas, R. C., Houston, J. E., Michalske, T. A.and Crooks, R. M., Physical Review Letters 69, 2790–2793 (1992).Google Scholar
[7].Johnson, K. L., Contact Mechanics. (1996), Cambridge: Cambridge University Press.Google Scholar
[8].Timoshenko, S. P. and Goodier, J. N., Theory of Elasticity. 3rd ed. (1970), New York: McGraw-Hill.Google Scholar
[9] Hertzberg, R. W., Deformation and Fracture of Engineering Materials. (1989), New York: John Wiley and Sons.Google Scholar
[10] Vlassak, J. J. and Nix, W. D., J. Mech. Phys. Solids 42, 1223–1245 (1994).Google Scholar
[11] Kiely, J. D. and Houston, J. E., Phys. Rev. B 57 12588 (1998).Google Scholar