Published online by Cambridge University Press: 15 February 2011
In-situ, ultra high vacuum combined scanning tunneling microscope/atomic force microscope (STM/AFM) studies were undertaken to examine the initiation of 3D InAs islands on GaAs (100) and their density and size distribution as a function of growth conditions. A decreasing island density with increasing As4 pressure is observed and points to the significance of strain in affecting In migration and As4 incorporation. A stack of InAs islands separated by GaAs spacer layers exhibit a vertically self-organized growth. Through analysis of a phenomenological model, this is shown to be a consequence of a directional In adatom migration caused by the islandinduced nonuniform strain fields.