Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-02T20:00:43.501Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Hvem Study of Ion Irradiation-Induced Grain Growth in Au Thin Films

Published online by Cambridge University Press:  25 February 2011

Joyce C. Liu ,
Jian Li ,
J. W. Mayer ,
Charles W. Allen  and
Lynn E. Rehn
Joyce C. Liu
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
Jian Li
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
J. W. Mayer
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
Charles W. Allen
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Lynn E. Rehn
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

In situ observations of 1.5 MeV Xe+ ion irradiated Au films at room temperature and at 150°C reveal the evolution of grain growth: the average grain size increases by the mechanisms of grain boundary migration and grain coalescence.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 128: Symposium A – Processing and Characterization of Materials Using Ion Beams , 1988 , 297
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Wang, P., Thompson, D. A. and Smeltzer, W. W., Nucl. Instrum. Methods B7/8, 97 (1985).Google Scholar
[2] Wang, P., Thompson, D. A. and Smeltzer, W. W., Nucl. Instrum. Methods B16, 288 (1986).CrossRefGoogle Scholar
[3] Atwater, H. A., Smith, H. I. and Thompson, C. V., in Beam-Solid Interactions and Phase Transformations, edited by Hurz, H., Olson, G. L. and Poate, J. M. (Materials Research Society, Pittsburgh, PA, 1986), Vol.51, p. 337.Google Scholar
[4] Atwater, H. A., Thompson, C. V. and Smith, H. I., J. Appl. Phys. 64, 2337 (1988).Google Scholar
[5] Taylor, A., Allen, C. W., and Ryan, E. A., Nucl. Instrum. Methods, B24/25, 598 (1987).Google Scholar
[6] Jager, W., J. Microsc. Spectrosc. Electron. 6, 437 (1981).Google Scholar
[7] Kirk, M. A., Robertson, I. M., Jenkins, M. L., English, C. A., Black, T. J., and Vetrano, J. S., J. Nucl. Mater. 149, 21 (1987).CrossRefGoogle Scholar
[8] Hillert, M., Acta Metall. 13, 227 (1965).CrossRefGoogle Scholar
[9] Hu, H. in Electron Microscopy and Strength of Crystals, edited by Thomas, G. and Washburn, J. (Interscience, New York, 1963) p. 546.Google Scholar
[10] Li, J. C. M., J. Appl. Phys. 33, 2958 (1962).Google Scholar