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Impedance Spectroscopic Study of Zinc Oxide Varistors

Published online by Cambridge University Press:  25 February 2011

A. Sadhu ,
Q. Banerjee ,
M. J. Patni  and
T. R. Rananohan
A. Sadhu
Affiliation:
Materials Science Center, Indian Institute Of Technology, Pattai, Bombay 400076, INDIA.
Q. Banerjee
Affiliation:
Department of Metallurgical Engineering, Indian Institute Of Technology, Pattai, Bombay 400076, INDIA.
M. J. Patni
Affiliation:
Materials Science Center, Indian Institute Of Technology, Pattai, Bombay 400076, INDIA.
T. R. Rananohan
Affiliation:
Department of Metallurgical Engineering, Indian Institute Of Technology, Pattai, Bombay 400076, INDIA.
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Abstract

Polycrystalline zinc oxide containing oxides of bismuth, cobalt, manganese and antimony is found to exhibit highly non-ohmic I–V characteristic arising due to the presence of schottky barriers at the grain boundaries. Defect states present at the grain–grain boundary interfaces store excess negative charge and give rise to such potential barriers. Any improvement in the I–V characteristics therefore demands the understanding of grain boundary properties of the material. Impedance spectroscopy is found to separate grain and grain boundary contributions in a polycrystalline material and is used to determine grain boundary contributions towards the electrical behavior of the zinc oxide varistors. It also helps in identifying stored charges and defect states present and elucidates different trapping phenomena occurring at the interface behavior of zinc oxide varistors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 238: Symposium Cb – Structure and Properties of Interfaces in Materials , 1991 , 323
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Morris, W.G., J. Vac Sci. Technal., 13, 926, 1976.CrossRefGoogle Scholar
2. Levineon, L.M. and Philipp, H.R., J. Appl. Phys., 46, 1332, 1975.CrossRefGoogle Scholar
3. Matsuoka, M., Jpn. J. Appl. Rhys., 10, 736, 1971.CrossRefGoogle Scholar
4. Blatter, G. and Greuter, F., Rhys. Rev., B34, 8553, 1986.Google Scholar
5. Baurele, J.E., J. Phys. Cheat. Solids, 30, 2657, 1969.CrossRefGoogle Scholar
6. Seitz, M., Hampton, F. and Richmond, W., Adv. Ceram. 7, 60, 1983.Google Scholar
7. Alim, H.A., J. Am. Ceram. Soc, 72, 28, 1989.CrossRefGoogle Scholar
8. Agnes, S., Baumard, J.F., Pierre, A. and Denanot, M.F., J. Appl. Phy., 63, 5116, 1989.Google Scholar
9. Mang, D. Y. and Umeya, K., J. Am. Ceram. Soc, 73, 669, 1990.Google Scholar