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Hrem Study of Ultra Thin Titanium Films

Published online by Cambridge University Press:  10 February 2011

T. Braisaz ,
P. Ruterana ,
G. Nouet ,
Ph. Komninou ,
Th. Kehagias ,
Th. Karakostas ,
P. Poulopoulos ,
M. Aggelakeris ,
N. Flevaris  and
A. Serra
T. Braisaz
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, [email protected]
P. Ruterana
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, [email protected]
G. Nouet
Affiliation:
Laboratoire d'Etudes et de Recherches sur les Matériaux, Unité associée CNRS 6004, Institut des Sciences de la Matière et du Rayonnement, 6 Boulevard du Maréchal Juin 14050 Caen Cedex, France, [email protected]
Ph. Komninou
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
Th. Kehagias
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
Th. Karakostas
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
P. Poulopoulos
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
M. Aggelakeris
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
N. Flevaris
Affiliation:
Aristotle University of Thessaloniki, Department of Physics, Solid State Section 313–1, Thessaloniki 54006, Greece, [email protected]
A. Serra
Affiliation:
Universität Politècnica de Catalunya, Department de Matemàtica Aplicada III, Ets de Caminos, Canales y Puertos de Barcelona, Gran Capita, S/N Modul C2, 08034 Barcelona, Spain, [email protected]
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Abstract

High resolution electron microscopy has been used to characterize the structure of ultra thin films of titanium deposited on KBr substrate by Ultra High Vacuum (UHV) electron-gun evaporation. The size of the grains has an order of magnitude of 10 nm whatever the substrate temperature. The observations have been carried out along <1123> zone axis. Some of the grains contain planar defects which were identified as the twin {1011}. The atomic structure of this twin is characterized by a mirror plane similar to that observed in polycrystalline titanium. Additionaly, this structure can be modified by a b2/2 twinning dislocation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 472: Symposium I – Polycrystalline Thin Films - Structure, Texture, Properties..III , 1997 , 391
Copyright
Copyright © Materials Research Society 1997

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References

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