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How to realize ultimate spatial and temporal resolutions by laser-combined scanning tunneling microscopy?

Published online by Cambridge University Press:  26 February 2011

Hidemi Shigekawa ,
Osamu Takeuchi ,
Masahiro Aoyama ,
Yasuhiko Terada ,
Hiroyuki Kondo  and
Haruhiro Oigawa
Hidemi Shigekawa
Affiliation:
[email protected], University of Tsukuba, Institute of Applied Physics, Tennodai 1-1-1, Tsukuba, 305-8573, Japan, +81-298-853-5276, +81-298-853-5276
Osamu Takeuchi
Affiliation:
[email protected]
Masahiro Aoyama
Affiliation:
[email protected]
Yasuhiko Terada
Affiliation:
[email protected]
Hiroyuki Kondo
Affiliation:
[email protected]
Haruhiro Oigawa
Affiliation:
[email protected]
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Abstract

By combining scanning tunneling microscopy (STM) and the optical pump-probe technique using a femtosecond pulse laser, we have developed a new microscopy, shaken pulse-pair-excited STM (SPPX-STM), that enables us to observe the dynamics of electronic structures with the ultimate spatial and temporal resolutions.

Keywords

scanning probe microscopy (SPM)lasernanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 901: Symposium R – Assembly at the Nanoscale – Toward Functional Nanostructured Materials , 2005 , 0901-Ra15-01
Copyright
Copyright © Materials Research Society 2006

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References

1 Takeuchi, O., Morita, R., Yamashita, M. and Shigekawa, H., Jpn. J. Appl. Phys. 41, 7B, 4994–4997 (2002).Google Scholar
2 Takeuchi, O., Aoyama, M., Oshima, R., Okada, Y., Oigawa, H., Sano, N., Morita, R., Yamashita, M. and Shigekawa, H., Appl. Phys. Lett. 85, 3268–3270 (2004).Google Scholar
3 Takeuchi, O. Aoyama, M. Kondo, H., Terada, Y. and Shigekawa, H., Jpn. J. Appl. Phys. (2006) in press.Google Scholar
4 Takeuchi, O. Aoyama, M. and Shigekawa, H., Jpn. J. Appl. Phys. 44, 7B, 5354–5357 (2005).Google Scholar
5 Takeuchi, O. and Shigekawa, H., “Mono-cycle Photonics and Optical Scanning Tunneling Microscopy” ed. Yamashita, M., Shigekawa, H., Morita, R., Springer Series in Optical Sciences, vol. 99 (2005).Google Scholar
6 Shigekawa, H., Takeuchi, O. and Aoyama, M., Science and Technology of Advanced Materials 6, 582 (2005).Google Scholar
7 Takeuchi, O., Yoshida, S. and Shigekawa, H., Appl. Phys. Lett. 84, 3645–3647 (2004).Google Scholar
8 Yoshida, S., Kikuchi, J., Kanitani, Y., Takeuchi, O., Oigawa, H. and Shigekawa, H., e-J. Surf. Sci. & Nanotechnol, in press.Google Scholar
9 Yoshida, S., Kimura, T., Takeuchi, O., Hata, K., Oigawa, H., Nagamura, T., and Shigekawa, H., Phys. Rev. B 70, 235411 (2004).Google Scholar
10 Yasuda, S., Nakamura, T., Matsumoto, M. and Shigekawa, H., J. Am. Chem. Soc. 125, 16430–16433 (2003).Google Scholar
11 Shigekawa, H., Miyake, K., Ishida, M., Hata, K., Oigawa, H., Nannichi, Y., Yoshizaki, R., Kawazu, A., Abe, T., Ozawa, T., Nagamura, T., Jpn. J. Appl. Phys. 35 L108–1084 (1996).Google Scholar
12 Shigekawa, H., Hata, K., Miyake, K., Ishida, M. and Ozawa, S., Phys. Rev. B 55, 15448 (1997).Google Scholar
13 Shigekawa, H., Miyake, K., Ishida, M. and Hata, K., Jpn. J. Appl. Phys. 36, L294–297 (1997).Google Scholar
14 Yoshida, S., Kimura, T., Takeuchi, O., Hata, K., Oigawa, H., Nagamura, T., Sakama, H., and Shigekawa, H., Phys. Rev. B 70, 235411 (2004).Google Scholar
15 Hata, K., Yoshida, S. and Shigekawa, H., Phys. Rev. Lett. 89, 286104 (2002).Google Scholar
16 Kimura, T., Yoshida, S., Takeuchi, O., Matsuyama, E., Oigawa, H. and Shigekawa, H., Jpn. J. Appl. Phys. 43, 7B, L990–L992 (2004).Google Scholar
17 Hata, K., Sainoo, Y. and Shigekawa, H., Phys. Rev. Lett. 86, 3084–3087 (2001).Google Scholar
18 Shah, J., “Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures” Springer, Solid State Science Series (1999).Google Scholar
19 Weiss, S., Botkin, D., Ogletree, D. F., Salmeron, M., Chemla, D. S., Phys. Stat. Sol. (b) 188, 343–359 (1995).Google Scholar
20 Freeman, M. R., Elezzabi, A. Y., Steeves, G. M., and Nunes, G. Jr., Surf. Sci. 386, 290–300 (1997).Google Scholar
21 Greoeneveld, R. H. M. and van Kempman, H., Appl. Phys. Lett. 69, 2294–2296 (1996).Google Scholar
22 Khusnatdinov, N. N., Nagle, T. J., and Nunes, G. Jr., Appl. Phys. Lett. 77, 4434–4436 (2000).Google Scholar
23 Hamers, R. J. and Cahill, D. G., J. Vac. Sci. Technol. B9, 514–518 (1991).Google Scholar
24 Grafstroem, S., J. Appl. Phys. 91, 1717 (2002).Google Scholar
25 Pfeiffer, W., Sattler, F., Vogler, S., Gerber, G., Grand, J. and Moller, R., Appl. Phys. B: Lasers Opt. 64, 265 (1997).Google Scholar