Published online by Cambridge University Press: 21 February 2011
The preparation of interfaces for TEM investigation is inherently prone to the production of artifacts. In some cases it is possible to avoid potential hazards in the interpretation of high-resolution images by creating the interfaces in pre-existing, thin, TEM specimens so that no further preparation is required. As an example of this approach, results from a study of interfaces produced by the heat-treatment of iron-bearing olivine TEM samples are presented. Image simulations are presented which show that even in these favorable situations, the greatest care must be taken in interpreting image contrast at interfaces in high-resolution electron micrographs.