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High Resolution UHV Electron Microscopy on Surfaces and Heteroepitaxy

Published online by Cambridge University Press:  21 February 2011

K. Takayanagi ,
Y. Tanishiro ,
K. Murooka  and
M. Mitome
K. Takayanagi
Affiliation:
Tokyo Institute of Technology, Graduate School at Nagatsuta, Materials Science and Engineering, 4259 Nagatsuta, Midoriku, Yokohama, Japan 227.
Y. Tanishiro
Affiliation:
Tokyo Institute of Technology, Physics Department, Ohokayama, Meguroku, Tokyo, Japan 152.
K. Murooka
Affiliation:
Tokyo Institute of Technology, Graduate School at Nagatsuta, Materials Science and Engineering, 4259 Nagatsuta, Midoriku, Yokohama, Japan 227.
M. Mitome
Affiliation:
Tokyo Institute of Technology, Graduate School at Nagatsuta, Materials Science and Engineering, 4259 Nagatsuta, Midoriku, Yokohama, Japan 227.
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Abstract

Surface structure observations by high-resolution UHV electron microscopy at the atomic level summarized. Both the profile imaging in transmission electron microscopy and superlattice imaging in reflection electron microscopy are applied to image the reconstructed structure of gold surfaces and Si(111)7×7 surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 59
Copyright
Copyright © Materials Research Society 1989

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References

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