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High resolution dynamic electrostatic force microscopy technique: quantifying electrical properties at the nanoscale.

Published online by Cambridge University Press:  12 March 2014

C. Maragliano ,
D. Heskes ,
M. Stefancich ,
M. Chiesa  and
T. Souier
C. Maragliano
Affiliation:
LENS Laboratory @ Institute Center for Future Energy Systems (iFES), Masdar Institute of Science and Technology, P.O.Box 54224, Abu Dhabi, UAE
D. Heskes
Affiliation:
LENS Laboratory @ Institute Center for Future Energy Systems (iFES), Masdar Institute of Science and Technology, P.O.Box 54224, Abu Dhabi, UAE
M. Stefancich
Affiliation:
LENS Laboratory @ Institute Center for Future Energy Systems (iFES), Masdar Institute of Science and Technology, P.O.Box 54224, Abu Dhabi, UAE
M. Chiesa
Affiliation:
LENS Laboratory @ Institute Center for Future Energy Systems (iFES), Masdar Institute of Science and Technology, P.O.Box 54224, Abu Dhabi, UAE
T. Souier
Affiliation:
LENS Laboratory @ Institute Center for Future Energy Systems (iFES), Masdar Institute of Science and Technology, P.O.Box 54224, Abu Dhabi, UAE
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Abstract

In electrostatic force microscopy (EFM), a conductive atomic force microscopy (AFM) tip is electrically biased against a grounded sample and electrostatic forces are investigated. This methodology has been broadly used in the scientific community to characterize dielectric properties of samples at the nanoscale. Two are the main operating conditions associated with this technique. The oscillation amplitude is usually kept to very small values to allow a linearized approach to the force reconstruction and the tip-sample distance is maintained elevated. However, this latter condition negatively affects the lateral resolution of the technique. Thus, electrostatic interaction should be probed in the vicinity of the sample. Theoretically, in this region the force can be linearized using oscillation amplitudes in the order of Å. This might cause the trapping of the tip on the surface (snap-in). Furthermore, at small distances, short-range forces (i.e. Van der Waals’) might reach values comparable to electrostatic forces.

Here we present a framework that combines EFM and dynamic amplitude modulation AFM to achieve decoupled reconstruction of forces. It permits reconstructing the real shape of the electrostatic force and the capacitance of the tip-sample system even in the vicinity of the surface. This is done using a technique proposed in literature by Sader and Katan to reconstruct the force without the linearization approximation. The steps needed to decouple short-range and electrostatic forces are explained in detail. This data can be employed to derive the electrical properties of thin films with enhanced lateral resolution with respect to the commonly used EFM techniques.

Keywords

electrical propertiesdielectric propertiesnanoscale
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1652: Symposium LL – Advances in Scanning Probe Microscopy , 2014 , mrsf13-1652-ll05-15
Copyright
Copyright © Materials Research Society 2014 

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References

Leutwyler, W. K., Bürgi, S. L., and Burgl, H, “Semiconductor clusters, nanocrystals, and quantum dots,” Science, vol. 271, p. 933, 1996.Google Scholar
Hess, C. M., Riley, E. A., Palos-Chávez, J., and Reid, P. J., “Measuring the Spatial Distribution of Dielectric Constants in Polymers through Quasi-Single Molecule Microscopy,” The Journal of Physical Chemistry B, 2013.CrossRefGoogle ScholarPubMed
Gascoyne, P. R., Shim, S., Noshari, J., Becker, F. F., and Stemke‐Hale, K., “Correlations between the dielectric properties and exterior morphology of cells revealed by dielectrophoretic field‐flow fractionation,” Electrophoresis, vol. 34, pp. 1042–1050, 2013.CrossRefGoogle ScholarPubMed
Gramse, G., Dols-Perez, A., Edwards, M., Fumagalli, L., and Gomila, G., “Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy,” Biophysical journal, vol. 104, pp. 1257–1262, 2013.CrossRefGoogle ScholarPubMed
Israelachvili, J. N., Intermolecular and surface forces: revised third edition: Academic press, 2011.Google Scholar
Fumagalli, L., Gramse, G., Esteban-Ferrer, D., Edwards, M. A., and Gomila, G., “Quantifying the dielectric constant of thick insulators using electrostatic force microscopy,” Applied Physics Letters, vol. 96, p. 183107, 2010.CrossRefGoogle Scholar
Schwartz, G., Riedel, C., Arinero, R., Tordjeman, P., Alegría, A., and Colmenero, J., “Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM),” Ultramicroscopy, vol. 111, pp. 1366–1369, 2011.CrossRefGoogle Scholar
Lu, W., Wang, D., and Chen, L., “Near-static dielectric polarization of individual carbon nanotubes,” Nano Letters, vol. 7, pp. 2729–2733, 2007.CrossRefGoogle ScholarPubMed
Cherniavskaya, O., Chen, L., Weng, V., Yuditsky, L., and Brus, L. E., “Quantitative noncontact electrostatic force imaging of nanocrystal polarizability,” The Journal of Physical Chemistry B, vol. 107, pp. 1525–1531, 2003.CrossRefGoogle Scholar
Riedel, C., Arinero, R., Tordjeman, P., Ramonda, M., Lévêque, G., Schwartz, G., et al. ., “Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy,” Journal of Applied Physics, vol. 106, pp. 024315–024315-6, 2009.CrossRefGoogle Scholar
Lei, C. H., Das, A., Elliott, M., and Macdonald, J. E., “Quantitative electrostatic force microscopy-phase measurements,” Nanotechnology, vol. 15, p. 627, 2004.CrossRefGoogle Scholar
Lilliu, S., Maragliano, C., Hampton, M., Elliott, M., Stefancich, M., Chiesa, M., et al. ., “EFM data mapped into 2D images of tip sample contact potential difference and capacitance second derivative,” Nat. Scient. Rep., 2013.Google ScholarPubMed
Giessibl, F. J., “Advances in atomic force microscopy,” Reviews of modern physics, vol. 75, p. 949, 2003.CrossRefGoogle Scholar
Maragliano, C., Heskes, D., Stefancich, M., Chiesa, M., and Souier, T., “Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution,” Nanotechnology, vol. 24, p. 225703, 2013.CrossRefGoogle Scholar
Sader, J. E., Uchihashi, T., Higgins, M. J., Farrell, A., Nakayama, Y., and Jarvis, S. P., “Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations,” Nanotechnology, vol. 16, p. S94, 2005.CrossRefGoogle Scholar
Katan, A. J., VanEs, M. H., and Oosterkamp, T. H., “Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique,” Nanotechnology, vol. 20, p. 165703, 2009.CrossRefGoogle ScholarPubMed
Colchero, J., Gil, A., and Bar, A. M., “Resolution enhancement and improved data interpretation in electrostatic force microscopy,” Phys. Rev. B, vol. 64, p. 245403, 2001.CrossRefGoogle Scholar
Gramse, G., Gomila, G., and Fumagalli, L., “Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe,” Nanotechnology, vol. 23, p. 205703, 2012.CrossRefGoogle ScholarPubMed
Fumagalli, L., Ferrari, G., Sampietro, M., and Gomila, G., “Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy,” Applied Physics Letters, vol. 91, p. 243110, 2007.CrossRefGoogle Scholar
Langton, N. H. and Matthews, D., “The dielectric constant of zinc oxide over a range of frequencies,” British Journal of Applied Physics, vol. 9, p. 453, 1958.CrossRefGoogle Scholar