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Growth Mechanisms and Surface Morphology of Ybco Based High-Tc Thin Films and Heterostructures for sns Junctions

Published online by Cambridge University Press:  10 February 2011

R. A. Rao  and
C. B. Eom
R. A. Rao
Affiliation:
Department of Mechanical Eng. and Materials Science, Duke University, Durham, NC 27708
C. B. Eom
Affiliation:
[email protected]
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Abstract

We have controlled the nanoscale growth mechanism and surface morphology of YBa2Cu3O7 (YBCO) based high-Tc thin films and heterostructures, using miscut SrTiO3 substrates. On exact (001) SrTiO3 substrates, the YBCO films grow in a screw dislocation growth mode. The barrier layers (La6.4Sr1.6Cu8O20 and PrBa2Cu3O7) grown on top of such a YBCO film also show spiral growth features, indicating pseudomorphic growth. On miscut substrates (with miscut angle ≥ 4° toward [010]) the YBCO films grow by step-flow. However, the La6.4Sr1. 6Cu8O20 layers grown on such YBCO bottom electrodes, show a high degree of step bunching with rough surface. In contrast, the PrBa2Cu3O7 layers show clear step-terrace surface morphology similar to the underlying YBCO bottom electrode, suggesting the existence of periodic nanoscale steps at the S-N interface. These heterostructures can be used for the fabrication of SNS Josephson junctions to take advantage of the proximity effect coupling at the nanoscale steps at the interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 574: Symposia BB – Multicomponent Oxide Films for Electronics , 1999 , 17
Copyright
Copyright © Materials Research Society 1999

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