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Growth and Characterization of Semicontinuous Metal Films by Pulsed Laser Ablation

Published online by Cambridge University Press:  21 March 2011

S.K. So ,
H.H. Fong  and
N.H. Cheung
S.K. So
Affiliation:
Department of Physics, Hong Kong Baptist University Kowloon Tong, Hong Kong, China
H.H. Fong
Affiliation:
Department of Physics, Hong Kong Baptist University Kowloon Tong, Hong Kong, China
N.H. Cheung
Affiliation:
Department of Physics, Hong Kong Baptist University Kowloon Tong, Hong Kong, China
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Abstract

Semicontinuous metals films of copper and gold were grown on different substrates by pulsed laser ablation. The resistance and transmittance of these growing metal films were monitored in situ vs film thickness. Despite diverse experimental variations, it was found that both resistance and transmittance exhibited similar behaviors. Around percolation, the resistance exhibited a sharp drop whereas the transmittance exhibited a dip. In general, the onset of percolation depended on laser fluence and substrates. Under favorable conditions, metal films as thin as 1.5 nm would percolate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 672: Symposium O – Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures , 2001 , O10.7
Copyright
Copyright © Materials Research Society 2001

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References

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