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Gate Bias Modulated Current Flow Analysis at Organic Semiconductor / Metal Interface for Developing High Performance Organic Fet

Published online by Cambridge University Press:  11 February 2011

Manabu Yoshida ,
Sei Uemura ,
Satoshi Hoshino ,
Takehito Kodzasa  and
Toshihide Kamata
Manabu Yoshida
Affiliation:
Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Central 5, 1–1–1 Higashi, Tsukuba, Ibaraki 305–8565, JAPAN
Sei Uemura
Affiliation:
Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Central 5, 1–1–1 Higashi, Tsukuba, Ibaraki 305–8565, JAPAN
Satoshi Hoshino
Affiliation:
Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Central 5, 1–1–1 Higashi, Tsukuba, Ibaraki 305–8565, JAPAN
Takehito Kodzasa
Affiliation:
Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Central 5, 1–1–1 Higashi, Tsukuba, Ibaraki 305–8565, JAPAN
Toshihide Kamata
Affiliation:
Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Central 5, 1–1–1 Higashi, Tsukuba, Ibaraki 305–8565, JAPAN
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Abstract

We have developed a current flow analysis system for Field Effect Transistors (FET) using a conductive cantilever of a probe microscope. Using this analysis system, nanoscale current images were observed on a pentacene active layer grown on a bottom electrode in ordinary FETs. When gold (Au) was employed as a bottom electrode, we found the special region around the electrode edge. The current flow hardly occurred in this region. On the other hand, using a conductive polymer (PEDOT) bottom electrode, such a region was not observed. From the detailed observation around the electrode edge, we concluded that the special region would be caused by diffusion of Au particles that evoked heterogeneous pentacene growth, and then the heterogeneity worked as a contact resistance.

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Articles
Information
MRS Online Proceedings Library (OPL) , Volume 734: Symposia A/B – Defect-Mediated Phenomena in Ordered Polymers – Polymer/Metal Interfaces and Defect Mediated Phenomena in Ordered Polymers , 2002 , B9.32
Copyright
Copyright © Materials Research Society 2003

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References

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