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FTIR Analysis of the Mechanisms of NOx Detection by Semiconductor Metal Oxide Nanoparticles

Published online by Cambridge University Press:  01 February 2011

Marie-Isabelle Baraton  and
Lhadi Merhari
Marie-Isabelle Baraton
Affiliation:
SPCTS - UMR CNRS, Faculty of Sciences, 87060-Limoges, France ([email protected])
Lhadi Merhari
Affiliation:
CERAMEC R&D, 87000-Limoges, France
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Abstract

The chemical reactions occurring at the surface of tin oxide nanoparticles under NOx adsorption have been investigated by Fourier transform infrared spectroscopy and correlated with the variations of the electrical conductivity of tin oxide. These surface reactions have been found dependent on the particle size and on the presence of oxygen. The strong coordination of the newly formed chemical species onto the nanoparticle surface may result in a poor reversibility of the sensor response.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 828: Symposium A – Semiconductor Materials for Sensing , 2004 , A4.8
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Baraton, M.-I. and Merhari, L., Mater. Trans. 42, 1616 (2001).Google Scholar
2. Baraton, M.-I. and Merhari, L., J. Nanopart. Res. 6, 107 (2004).Google Scholar
3. Williams, G. and Coles, G.S.V., J. Mater. Chem. 8, 1657 (1998).Google Scholar
4. Baraton, M.-I. and Merhari, L., Scripta Materialia 44, 1643 (2001).Google Scholar
5. Baraton, M.-I., “Surface Analysis of Semiconducting Nanoparticles by FTIR Spectroscopy: Application to the Evaluation of Gas Sensing Properties”, Nanocrystalline Metals and Oxides: Selected Properties and Applications, eds. Knauth, P. and Schoonman, J. (Kluwer, 2002) pp. 165–187.Google Scholar
6. Ferkel, H., Naser, J., and Riehemann, W., Nanostruct. Mater. 8, 457 (1997).Google Scholar
7. Baraton, M.-I., “FT-IR surface spectrometries of nanosized particles”, Handbook of Nanostruct. Mater. & Nanotechnology, ed. Nalwa, H.S. (Academic Press, 1999) pp. 89–153.Google Scholar
8. Hadjiivanov, K.I., Catal. Rev. – Sci. Eng. 42, 71 (2000).Google Scholar
9. Harrick, N.J., Phys. Rev. 125, 1165 (1962).Google Scholar
10. Klingenberg, B. and Vannice, M.A., Appl. Catal. B 21, 19 (1999).Google Scholar