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Fracto-Emission from Interfacial Failure

Published online by Cambridge University Press:  22 February 2011

J. T. Dickinson
J. T. Dickinson*
Affiliation:
Department of Physics, Washington State University, Pullman, WA 99164-2814
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Abstract

Fracto-Emission is the emission of particles and photons during and after fracture of materials. The observed emission includes electrons, negative and positive ions, neutral species in both ground states and in excited states, and visible photons. This emission can often serve as a sensitive probe of crack growth and may prove to be a useful tool for investigating molecular and microscopic events accompanying crack growth and for studying the details of failure modes in a variety of materials. Interfacial failure provides unique fracto-emission signals due to the extensive charge separation accompanying separation of dissimilar materials. Here we present the results of several recent studies of interfacial failure involving a variety of materials and relate them to electronic and mechanical processes accompanying failure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 153: Symposium J – Interfaces Between Polymers, Metals, and Ceramics , 1989 , 331
Copyright
Copyright © Materials Research Society 1989

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References

1. Zink, J. I., Naturwissenschaften 68, 507 (1981).Google Scholar
2. Walton, A. J., Adv. Phys. 26, 887 (1977).Google Scholar
3. Dickinson, J. T., to appear in Advances in Adhesion, edited by Lee, L. H., (Plenum Press, New York).Google Scholar
4. Knotek, M. L., AIP Conference Proc. No. 94, 772 (1982).Google Scholar
5. Grayson, M. and Wolf, C., J. Polym. Sci., Polym. Phys. Ed. 23, 1087 (1985).Google Scholar
6. DeVries, K. L., J. Appl, Polym. Sci.: Appl. Polym. Symp., edited by Ranby, B. and Rabek, J. F., (John Wiley & Sons, New York, 1979), p. 3355.Google Scholar
7. Dickinson, J. T., Jensen, L. C., and Bhattacharya, S., in Makromol. Chem.. Macromol. Symnp, 7, 129 (1987).Google Scholar
8. Langford, S. C., Zhenyi, Ma, and Dickinson, J. T., to appear in J. Mater. Res.Google Scholar
9. Mandelbrot, B. B., Physica Scripta 32, 257 (1985).Google Scholar
10. Mandelbrot, B. B., Passoja, D. E., and Paullay, A. J., Nature 30, 721 (1984).Google Scholar
11. Ravi-Chandar, K. and Knauss, W. G., Int. J. Fracture 26, 141 (1984).Google Scholar
12. Dempsey, J. P. and Burgers, P., Int. J. Fracture 27, 203 (1985).Google Scholar
13. Underwood, E. E. and Banerji, K., Mater. Sci. Engin. 80, 1 (1986).Google Scholar
14. Mecholsky, J. J., Mackin, T. J., and Passoja, D. E., in Fractography of Glasses and Ceramics, edited by Varner, J. R. and Frechette, V. D., (American Ceramic Society, Westerville, OH, USA, 1988), p. 127.Google Scholar
15. Passoja, D. E., in Fractography of Glasses and Ceramics, edited by Varner, J. R. and Frechette, V. D., (American Ceramic Society, Westerville, OH, USA, 1988), p. 101.Google Scholar
16. Mecholsky, J. J., Passoja, D. E., and Feinberg-Ringel, K. S., J. Am. Ceram. Soc. 72, 60 (1989).Google Scholar
17. Crasto, A. S., Corey, R., Dickinson, J. T., Subramanian, R. V., and Eckstein, Y., Composites Sci. & Technol. 30, 35 (1987).Google Scholar
18. Atkinson, C., Avila, J., Betz, F., and Smelser, R. E., J. Mech. Phys. Solids 30, 97 (1982).Google Scholar
19. Donaldson, E. E., Dickinson, J. T., and Shen, X. A., J. Adhesion 19, 267 (1986).Google Scholar
20. Zhenyi, Ma, Jiawen, Fan, and Dickinson, J. T., J. Adhesion 25, 63 (1988).Google Scholar
21. Dickinson, J. T. and Donaldson, E. E., J. Adhesion 24, 199 (1987).Google Scholar
22. Donaldson, E. E. and Dickinson, J. T., to appear in J. Adhesion.Google Scholar
23. Walker, J., Sci. Am. 257, 138 (December 1987).Google Scholar
24. Deryagin, B. V., Tyurikova, L. A., Krotova, N. A., and Toporov, Y. P., IEEE Trans. Indust. Appl. VI. IA–14, 541 (1978).Google Scholar
25. Ohara, K. and Hata, T., J. Appl. Polym. Sci. 14, 2097 (1970).Google Scholar
26. Klyuev, V. A., Revina, E. S., Anisimova, V. I., Khrustalev, Yu. A., and Toporov, Y. P., Colloid J. [Kolloidn Zh.] 41, 287 (1979).Google Scholar
27. Pearse, R. W. B. and Gaydon, A. G., The Identification of Molecular Spectra, (John Wiley & Sons, New York, 1941), p. 137.Google Scholar
28. Dickinson, J. T., Doering, D. L., and Langford, S. C., in Atomic and Molecular Processingof Electronic and Ceramic Materials:Preparation, Characterization, and Properties, edited by Aksay, I. H. et. al., (Materials Research Society, Pittsburgh, 1988), p. 39.Google Scholar