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The Finite Electromigration Boundary Value Problem

Published online by Cambridge University Press:  21 February 2011

J.R. Lloyd  and
J. Kitchin
J.R. Lloyd
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, 71 Seestraβe, Stuttgart, Germany
J. Kitchin
Affiliation:
Digital Equipment Corporation, 77 Reed Road, Hudson MA 01749-2895
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Abstract

The solution to the finite electromigration boundary value problem has been obtained for the case of a blocking boundary downstream and a constant vacancy concentration upstream. The results are similar to the solution to the semi-infinite problem [1] except in the vicinity of the steady state. Consequences of achieving a “sub-threshold” steady state profile are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 309: Symposium M2 – Materials Reliability in Microelectronics III , 1993 , 339
Copyright
Copyright © Materials Research Society 1993

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References

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